Frictional and collector pressure losses in rectangular microchannels
In this paper a new measurement method is developed to determine the friction factors in microchannels. Based on a set of experiments at variable microchannel lengths the friction factor can be derived by least-squares fitting well-established pressure loss correlations. Furthermore, collector losse...
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creator | Saenen, T. Persoons, T. Peirs, J. Baelmans, M. |
description | In this paper a new measurement method is developed to determine the friction factors in microchannels. Based on a set of experiments at variable microchannel lengths the friction factor can be derived by least-squares fitting well-established pressure loss correlations. Furthermore, collector losses and developing flow regime can be identified. An experimental set-up is build to demonstrate this method. It is found that the friction factors obtained with the new method correspond very well with the values obtained from conventional correlations. However the measurements also show a significantly lower critical Reynolds number (1400-1800) than the conventional value for channel flow. However the Obot-Jones model combined with the empirical correlations of Samoilenko do predict the critical Reynolds number well. For the collector losses the obtained values have a large spread but tend to values lower than the values obtained by conventional correlations. These losses also show a dependence on Reynolds number in the laminar regime which is not retrieved in macro scale correlations. |
doi_str_mv | 10.1109/STHERM.2009.4810752 |
format | Conference Proceeding |
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Based on a set of experiments at variable microchannel lengths the friction factor can be derived by least-squares fitting well-established pressure loss correlations. Furthermore, collector losses and developing flow regime can be identified. An experimental set-up is build to demonstrate this method. It is found that the friction factors obtained with the new method correspond very well with the values obtained from conventional correlations. However the measurements also show a significantly lower critical Reynolds number (1400-1800) than the conventional value for channel flow. However the Obot-Jones model combined with the empirical correlations of Samoilenko do predict the critical Reynolds number well. For the collector losses the obtained values have a large spread but tend to values lower than the values obtained by conventional correlations. These losses also show a dependence on Reynolds number in the laminar regime which is not retrieved in macro scale correlations.</description><identifier>ISSN: 1065-2221</identifier><identifier>ISBN: 1424436648</identifier><identifier>ISBN: 9781424436644</identifier><identifier>EISSN: 2577-1000</identifier><identifier>EISBN: 9781424436651</identifier><identifier>EISBN: 1424436656</identifier><identifier>DOI: 10.1109/STHERM.2009.4810752</identifier><language>eng</language><publisher>IEEE</publisher><subject>Contraction losses ; Electronics cooling ; Expansion losses ; Fluid flow measurement ; Friction ; Frictional pressure losses ; Length measurement ; Loss measurement ; Mechanical engineering ; Microchannel ; Microchannels ; Pressure measurement ; Single-phase ; Temperature ; Water heating</subject><ispartof>2009 25th Annual IEEE Semiconductor Thermal Measurement and Management Symposium, 2009, p.121-127</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/4810752$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,776,780,785,786,2052,27902,54895</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/4810752$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Saenen, T.</creatorcontrib><creatorcontrib>Persoons, T.</creatorcontrib><creatorcontrib>Peirs, J.</creatorcontrib><creatorcontrib>Baelmans, M.</creatorcontrib><title>Frictional and collector pressure losses in rectangular microchannels</title><title>2009 25th Annual IEEE Semiconductor Thermal Measurement and Management Symposium</title><addtitle>STHERM</addtitle><description>In this paper a new measurement method is developed to determine the friction factors in microchannels. Based on a set of experiments at variable microchannel lengths the friction factor can be derived by least-squares fitting well-established pressure loss correlations. Furthermore, collector losses and developing flow regime can be identified. An experimental set-up is build to demonstrate this method. It is found that the friction factors obtained with the new method correspond very well with the values obtained from conventional correlations. However the measurements also show a significantly lower critical Reynolds number (1400-1800) than the conventional value for channel flow. However the Obot-Jones model combined with the empirical correlations of Samoilenko do predict the critical Reynolds number well. For the collector losses the obtained values have a large spread but tend to values lower than the values obtained by conventional correlations. These losses also show a dependence on Reynolds number in the laminar regime which is not retrieved in macro scale correlations.</description><subject>Contraction losses</subject><subject>Electronics cooling</subject><subject>Expansion losses</subject><subject>Fluid flow measurement</subject><subject>Friction</subject><subject>Frictional pressure losses</subject><subject>Length measurement</subject><subject>Loss measurement</subject><subject>Mechanical engineering</subject><subject>Microchannel</subject><subject>Microchannels</subject><subject>Pressure measurement</subject><subject>Single-phase</subject><subject>Temperature</subject><subject>Water heating</subject><issn>1065-2221</issn><issn>2577-1000</issn><isbn>1424436648</isbn><isbn>9781424436644</isbn><isbn>9781424436651</isbn><isbn>1424436656</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2009</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNo1kMtOwzAURM1LIi39gm78Aym-144fS1SlLVIREpR15bgOGLlJZacL_p5IlNUszuhIM4TMgS0AmHl8323qt5cFMmYWQgNTFV6RmVEaBArBpazgmhRYKVUCY-yGTP6B0LekACarEhHhnkxy_h4bCmVVkHqVghtC39lIbXegro_Ru6FP9JR8zufkaexz9pmGjqaR2O7zHG2ix-BS775s1_mYH8hda2P2s0tOyceq3i035fZ1_bx82pYBVDWU_KCZQNNwrqwzDTYABp0TBluDwF3TirZVutHSCgTmhB2nSKUleMkbYfmUzP-8wXu_P6VwtOlnf7mD_wI4vlAg</recordid><startdate>200903</startdate><enddate>200903</enddate><creator>Saenen, T.</creator><creator>Persoons, T.</creator><creator>Peirs, J.</creator><creator>Baelmans, M.</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope></search><sort><creationdate>200903</creationdate><title>Frictional and collector pressure losses in rectangular microchannels</title><author>Saenen, T. ; Persoons, T. ; Peirs, J. ; Baelmans, M.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i175t-3d80429b337ac9b2b1192cc492f9213cbf4ff78b86a4210c4a10067861e63b4a3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2009</creationdate><topic>Contraction losses</topic><topic>Electronics cooling</topic><topic>Expansion losses</topic><topic>Fluid flow measurement</topic><topic>Friction</topic><topic>Frictional pressure losses</topic><topic>Length measurement</topic><topic>Loss measurement</topic><topic>Mechanical engineering</topic><topic>Microchannel</topic><topic>Microchannels</topic><topic>Pressure measurement</topic><topic>Single-phase</topic><topic>Temperature</topic><topic>Water heating</topic><toplevel>online_resources</toplevel><creatorcontrib>Saenen, T.</creatorcontrib><creatorcontrib>Persoons, T.</creatorcontrib><creatorcontrib>Peirs, J.</creatorcontrib><creatorcontrib>Baelmans, M.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Saenen, T.</au><au>Persoons, T.</au><au>Peirs, J.</au><au>Baelmans, M.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Frictional and collector pressure losses in rectangular microchannels</atitle><btitle>2009 25th Annual IEEE Semiconductor Thermal Measurement and Management Symposium</btitle><stitle>STHERM</stitle><date>2009-03</date><risdate>2009</risdate><spage>121</spage><epage>127</epage><pages>121-127</pages><issn>1065-2221</issn><eissn>2577-1000</eissn><isbn>1424436648</isbn><isbn>9781424436644</isbn><eisbn>9781424436651</eisbn><eisbn>1424436656</eisbn><abstract>In this paper a new measurement method is developed to determine the friction factors in microchannels. Based on a set of experiments at variable microchannel lengths the friction factor can be derived by least-squares fitting well-established pressure loss correlations. Furthermore, collector losses and developing flow regime can be identified. An experimental set-up is build to demonstrate this method. It is found that the friction factors obtained with the new method correspond very well with the values obtained from conventional correlations. However the measurements also show a significantly lower critical Reynolds number (1400-1800) than the conventional value for channel flow. However the Obot-Jones model combined with the empirical correlations of Samoilenko do predict the critical Reynolds number well. For the collector losses the obtained values have a large spread but tend to values lower than the values obtained by conventional correlations. These losses also show a dependence on Reynolds number in the laminar regime which is not retrieved in macro scale correlations.</abstract><pub>IEEE</pub><doi>10.1109/STHERM.2009.4810752</doi><tpages>7</tpages></addata></record> |
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ispartof | 2009 25th Annual IEEE Semiconductor Thermal Measurement and Management Symposium, 2009, p.121-127 |
issn | 1065-2221 2577-1000 |
language | eng |
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source | IEEE Electronic Library (IEL) Conference Proceedings |
subjects | Contraction losses Electronics cooling Expansion losses Fluid flow measurement Friction Frictional pressure losses Length measurement Loss measurement Mechanical engineering Microchannel Microchannels Pressure measurement Single-phase Temperature Water heating |
title | Frictional and collector pressure losses in rectangular microchannels |
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