Dynamic test signal design for analog ICs

In this paper we present an approach to construct dynamic test signals for analog circuits. Using the integral measure for characterizing time-domain signals, we extend the minmax formulation of the static test problem to the dynamic case. A sub-optimal solution strategy, similar to dynamic programm...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Devarayanadurg, G., Soma, M.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Analog circuits Circuit faults Circuit testing Contracts Optimal control Rails Signal design Switches Time domain analysis Voltage control
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