Fully Automatical Test and Qualification System for a High Endurance Embedded EEPROM Module

Qualifying a high temperature, high endurance and high reliability integrated EEPROM process module according the JEDEC and AEC standard needs a large number of tested devices. Correlations of various analog and digital measurements must be done at different supply voltages, temperature conditions a...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Fellner, J., Schatzberger, G., Wiesner, A.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Automatic testing Costs EPROM Packaging machines Qualifications Semiconductor device measurement System testing Temperature Time measurement Voltage
Online-Zugang:	Volltext bestellen
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