DRAM - A Personal View

Based on his work in the design, specification and test of DRAM for over thirty years, Dr. Richard Foss charts the crucial role of Dynamic Random Access Memory in the intertwined development of the computer and semiconductor industries, and highlights the influence of Moore's Law, whose tentacl...

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Veröffentlicht in:	IEEE Solid-State Circuits Society Newsletter 2008, Vol.13 (1), p.50-56
1. Verfasser:	Foss, R.C.
Format:	Artikel
Sprache:	eng
Schlagworte:	CMOS integrated circuits Companies Random access memory SDRAM Substrates Temperature sensors Transistors
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