DRAM - A Personal View
Based on his work in the design, specification and test of DRAM for over thirty years, Dr. Richard Foss charts the crucial role of Dynamic Random Access Memory in the intertwined development of the computer and semiconductor industries, and highlights the influence of Moore's Law, whose tentacl...
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| Veröffentlicht in: | IEEE Solid-State Circuits Society Newsletter 2008, Vol.13 (1), p.50-56 |
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| container_title | IEEE Solid-State Circuits Society Newsletter |
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| creator | Foss, R.C. |
| description | Based on his work in the design, specification and test of DRAM for over thirty years, Dr. Richard Foss charts the crucial role of Dynamic Random Access Memory in the intertwined development of the computer and semiconductor industries, and highlights the influence of Moore's Law, whose tentacles reach into every aspect of modern life. |
| doi_str_mv | 10.1109/N-SSC.2008.4785693 |
| format | Article |
| fullrecord | <record><control><sourceid>crossref_RIE</sourceid><recordid>TN_cdi_ieee_primary_4785693</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>4785693</ieee_id><sourcerecordid>10_1109_N_SSC_2008_4785693</sourcerecordid><originalsourceid>FETCH-LOGICAL-c908-fb5ed58f78a1e879f2187df73baabd5609b8d77c86dabfb33ae6ca70f4809b1e3</originalsourceid><addsrcrecordid>eNo9j0tLAzEURrNQsNRuXehm_kDGPCbJzXIYn1Cr2OI2JJMbGKlWkoX4701p9W7u4nA-OIRcctZyzuz1iq7XQysYg7YzoLSVJ2RWAdBOSHFGFqW8s3pKc-B8Ri5uXvunhjZ984K57D79tnmb8PucnCa_Lbg4_jnZ3N1uhge6fL5_HPolHS0DmoLCqCAZ8BzB2CQ4mJiMDN6HqDSzAaIxI-joQwpSetSjNyx1UBFHOSfiMDvmXSkZk_vK04fPP44zt-9xK1d73L7HHXuqdHWQJkT8F_7oL3U5Rtg</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>DRAM - A Personal View</title><source>IEEE Electronic Library (IEL)</source><creator>Foss, R.C.</creator><creatorcontrib>Foss, R.C.</creatorcontrib><description>Based on his work in the design, specification and test of DRAM for over thirty years, Dr. Richard Foss charts the crucial role of Dynamic Random Access Memory in the intertwined development of the computer and semiconductor industries, and highlights the influence of Moore's Law, whose tentacles reach into every aspect of modern life.</description><identifier>ISSN: 1098-4232</identifier><identifier>DOI: 10.1109/N-SSC.2008.4785693</identifier><language>eng</language><publisher>IEEE</publisher><subject>CMOS integrated circuits ; Companies ; Random access memory ; SDRAM ; Substrates ; Temperature sensors ; Transistors</subject><ispartof>IEEE Solid-State Circuits Society Newsletter, 2008, Vol.13 (1), p.50-56</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c908-fb5ed58f78a1e879f2187df73baabd5609b8d77c86dabfb33ae6ca70f4809b1e3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/4785693$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,777,781,793,4010,27904,27905,27906,54739</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/4785693$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Foss, R.C.</creatorcontrib><title>DRAM - A Personal View</title><title>IEEE Solid-State Circuits Society Newsletter</title><addtitle>N-SSC</addtitle><description>Based on his work in the design, specification and test of DRAM for over thirty years, Dr. Richard Foss charts the crucial role of Dynamic Random Access Memory in the intertwined development of the computer and semiconductor industries, and highlights the influence of Moore's Law, whose tentacles reach into every aspect of modern life.</description><subject>CMOS integrated circuits</subject><subject>Companies</subject><subject>Random access memory</subject><subject>SDRAM</subject><subject>Substrates</subject><subject>Temperature sensors</subject><subject>Transistors</subject><issn>1098-4232</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2008</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNo9j0tLAzEURrNQsNRuXehm_kDGPCbJzXIYn1Cr2OI2JJMbGKlWkoX4701p9W7u4nA-OIRcctZyzuz1iq7XQysYg7YzoLSVJ2RWAdBOSHFGFqW8s3pKc-B8Ri5uXvunhjZ984K57D79tnmb8PucnCa_Lbg4_jnZ3N1uhge6fL5_HPolHS0DmoLCqCAZ8BzB2CQ4mJiMDN6HqDSzAaIxI-joQwpSetSjNyx1UBFHOSfiMDvmXSkZk_vK04fPP44zt-9xK1d73L7HHXuqdHWQJkT8F_7oL3U5Rtg</recordid><startdate>2008</startdate><enddate>2008</enddate><creator>Foss, R.C.</creator><general>IEEE</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>2008</creationdate><title>DRAM - A Personal View</title><author>Foss, R.C.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c908-fb5ed58f78a1e879f2187df73baabd5609b8d77c86dabfb33ae6ca70f4809b1e3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2008</creationdate><topic>CMOS integrated circuits</topic><topic>Companies</topic><topic>Random access memory</topic><topic>SDRAM</topic><topic>Substrates</topic><topic>Temperature sensors</topic><topic>Transistors</topic><toplevel>online_resources</toplevel><creatorcontrib>Foss, R.C.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><jtitle>IEEE Solid-State Circuits Society Newsletter</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Foss, R.C.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>DRAM - A Personal View</atitle><jtitle>IEEE Solid-State Circuits Society Newsletter</jtitle><stitle>N-SSC</stitle><date>2008</date><risdate>2008</risdate><volume>13</volume><issue>1</issue><spage>50</spage><epage>56</epage><pages>50-56</pages><issn>1098-4232</issn><abstract>Based on his work in the design, specification and test of DRAM for over thirty years, Dr. Richard Foss charts the crucial role of Dynamic Random Access Memory in the intertwined development of the computer and semiconductor industries, and highlights the influence of Moore's Law, whose tentacles reach into every aspect of modern life.</abstract><pub>IEEE</pub><doi>10.1109/N-SSC.2008.4785693</doi><tpages>7</tpages></addata></record> |
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| identifier | ISSN: 1098-4232 |
| ispartof | IEEE Solid-State Circuits Society Newsletter, 2008, Vol.13 (1), p.50-56 |
| issn | 1098-4232 |
| language | eng |
| recordid | cdi_ieee_primary_4785693 |
| source | IEEE Electronic Library (IEL) |
| subjects | CMOS integrated circuits Companies Random access memory SDRAM Substrates Temperature sensors Transistors |
| title | DRAM - A Personal View |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-18T08%3A10%3A51IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-crossref_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=DRAM%20-%20A%20Personal%20View&rft.jtitle=IEEE%20Solid-State%20Circuits%20Society%20Newsletter&rft.au=Foss,%20R.C.&rft.date=2008&rft.volume=13&rft.issue=1&rft.spage=50&rft.epage=56&rft.pages=50-56&rft.issn=1098-4232&rft_id=info:doi/10.1109/N-SSC.2008.4785693&rft_dat=%3Ccrossref_RIE%3E10_1109_N_SSC_2008_4785693%3C/crossref_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=4785693&rfr_iscdi=true |