Improved statistical method for system-level ESD tests

A method for system-level electrostatic discharge (ESD) tests based on both upper and lower statistical limits for system failure probability in an ESD environment is described. This test method specifies test performance with statistical parameters instead of with the more conventional, but less in...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	Renninger, R.G.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Electrostatic discharge IEC standards Manufacturing Probability Reliability Robustness Statistical analysis System testing Upper bound Voltage
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