Low-Cost One-Port Approach for Testing Integrated RF Substrates

Low-cost testing of integrated RF substrates is necessary to reduce their production cost. In this paper a new low-cost test approach is proposed for testing an integrated RF substrate with embedded RF passive filters. As compared to a conventional test method the proposed test method reduces the te...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Goyal, A., Swaminathan, M.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Circuit testing Condition monitoring Costs Embedded RF Passive Filters Frequency conversion Integrated circuit measurements Low-Cost Method Oscillators Passive filters Probes Production Radio frequency Resonance Based Test Testing Integrated RF Substrates
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