We Need Faster & Deeper Scan and More Realistic Tests

A hundredfold increase of scan data volume has been predicted for the next ten years. This position statement discusses the implications on ATE and EDA, within the constraints of test cost, quality, and time-to-market. The first conclusion will be that the demand for more scan data can be met withou...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	Rivoir, J.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Automatic test pattern generation CMOS technology Costs Electronic design automation and methodology Packaging Pins Stress control System testing Test data compression Time to market
Online-Zugang:	Volltext bestellen
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