A T-Coil-Enhanced 8.5 Gb/s High-Swing SST Transmitter in 65 nm Bulk CMOS With ≪ -16 dB Return Loss Over 10 GHz Bandwidth
A source-series-terminated (SST) transmitter in a 65 nm bulk CMOS technology is presented. The circuit exhibits an eye height greater than 1.0 V for data rates of up to 8.5 Gb/s. A thin-oxide pre-driver stage running at 1.0 V drives 22 parallel connected thick-oxide SST output stages operated at 1.5...
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| Veröffentlicht in: | IEEE journal of solid-state circuits 2008-12, Vol.43 (12), p.2905-2920 |
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| container_title | IEEE journal of solid-state circuits |
| container_volume | 43 |
| creator | Kossel, M. Menolfi, C. Weiss, J. Buchmann, P. von Bueren, G. Rodoni, L. Morf, T. Toifl, T. Schmatz, M. |
| description | A source-series-terminated (SST) transmitter in a 65 nm bulk CMOS technology is presented. The circuit exhibits an eye height greater than 1.0 V for data rates of up to 8.5 Gb/s. A thin-oxide pre-driver stage running at 1.0 V drives 22 parallel connected thick-oxide SST output stages operated at 1.5 V that feature a 5-bit 2-tap FIR filter whose adaptation is independent of the impedance tuning. To achieve a return loss of |
| doi_str_mv | 10.1109/JSSC.2008.2006230 |
| format | Article |
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The circuit exhibits an eye height greater than 1.0 V for data rates of up to 8.5 Gb/s. A thin-oxide pre-driver stage running at 1.0 V drives 22 parallel connected thick-oxide SST output stages operated at 1.5 V that feature a 5-bit 2-tap FIR filter whose adaptation is independent of the impedance tuning. To achieve a return loss of <-16 dB up to 10 GHz a 40 mum times 40 mum T-coil complements the transmitter output. This half-bit-rate clock SST transmitter has a duty-cycle restoration capability of 5x, and the common-mode voltage noise is below 10 mV rms for high-, mid- and low-level terminations. The chip consumes 96 mW at 8.5 Gb/s and occupies 180 mum times 360 mum. In addition to the transmitter design, guidelines for the T-coil design are presented.</description><identifier>ISSN: 0018-9200</identifier><identifier>EISSN: 1558-173X</identifier><identifier>DOI: 10.1109/JSSC.2008.2006230</identifier><identifier>CODEN: IJSCBC</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Applied sciences ; Circuit properties ; Circuits ; Clocks ; CMOS technology ; De-emphasis ; Design. Technologies. Operation analysis. Testing ; Electric, optical and optoelectronic circuits ; Electronic circuits ; Electronics ; Exact sciences and technology ; Finite impulse response filter ; Frequency filters ; Guidelines ; Image restoration ; Impedance ; impedance tuning ; Integrated circuits ; Propagation losses ; return loss ; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices ; source series termination ; T-coil ; Transmitters ; Voltage</subject><ispartof>IEEE journal of solid-state circuits, 2008-12, Vol.43 (12), p.2905-2920</ispartof><rights>2009 INIST-CNRS</rights><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2008</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c385t-3db4ad253841721f90f2d24998b55776260255233cdbeb53e1f4825487d26e043</citedby><cites>FETCH-LOGICAL-c385t-3db4ad253841721f90f2d24998b55776260255233cdbeb53e1f4825487d26e043</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/4684644$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,314,780,784,789,790,796,23930,23931,25140,27924,27925,54758</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/4684644$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=21033859$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Kossel, M.</creatorcontrib><creatorcontrib>Menolfi, C.</creatorcontrib><creatorcontrib>Weiss, J.</creatorcontrib><creatorcontrib>Buchmann, P.</creatorcontrib><creatorcontrib>von Bueren, G.</creatorcontrib><creatorcontrib>Rodoni, L.</creatorcontrib><creatorcontrib>Morf, T.</creatorcontrib><creatorcontrib>Toifl, T.</creatorcontrib><creatorcontrib>Schmatz, M.</creatorcontrib><title>A T-Coil-Enhanced 8.5 Gb/s High-Swing SST Transmitter in 65 nm Bulk CMOS With ≪ -16 dB Return Loss Over 10 GHz Bandwidth</title><title>IEEE journal of solid-state circuits</title><addtitle>JSSC</addtitle><description>A source-series-terminated (SST) transmitter in a 65 nm bulk CMOS technology is presented. The circuit exhibits an eye height greater than 1.0 V for data rates of up to 8.5 Gb/s. A thin-oxide pre-driver stage running at 1.0 V drives 22 parallel connected thick-oxide SST output stages operated at 1.5 V that feature a 5-bit 2-tap FIR filter whose adaptation is independent of the impedance tuning. To achieve a return loss of <-16 dB up to 10 GHz a 40 mum times 40 mum T-coil complements the transmitter output. This half-bit-rate clock SST transmitter has a duty-cycle restoration capability of 5x, and the common-mode voltage noise is below 10 mV rms for high-, mid- and low-level terminations. The chip consumes 96 mW at 8.5 Gb/s and occupies 180 mum times 360 mum. In addition to the transmitter design, guidelines for the T-coil design are presented.</description><subject>Applied sciences</subject><subject>Circuit properties</subject><subject>Circuits</subject><subject>Clocks</subject><subject>CMOS technology</subject><subject>De-emphasis</subject><subject>Design. Technologies. Operation analysis. Testing</subject><subject>Electric, optical and optoelectronic circuits</subject><subject>Electronic circuits</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Finite impulse response filter</subject><subject>Frequency filters</subject><subject>Guidelines</subject><subject>Image restoration</subject><subject>Impedance</subject><subject>impedance tuning</subject><subject>Integrated circuits</subject><subject>Propagation losses</subject><subject>return loss</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><subject>source series termination</subject><subject>T-coil</subject><subject>Transmitters</subject><subject>Voltage</subject><issn>0018-9200</issn><issn>1558-173X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2008</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNp9kc9uEzEQxlcIJELhARCXERJwcur_6z02q5KAUkXqBsHN8q69jcvG2643VPQNeBUeq0-Co0Q9cOjFI2t-32jm-7LsLcFTQnBx-rWqyinFWO0fSRl-lk2IEAqRnP14nk0wJgoVqfcyexXjdfpyrsgkuz-DNSp736HzsDGhcRbUVMC8Po2w8FcbVN35cAVVtYb1YELc-nF0A_gAUkDYwmzX_YTyYlXBdz9u4OHPX0BEgp3BpRt3Q4BlHyOsfiUNwTBf3MPMBHvn7bh5nb1oTRfdm2M9yb59Pl-XC7Rczb-UZ0vUMCVGxGzNjaWCKU5yStoCt9RSXhSqFiLPJZWYCkEZa2ztasEcabmigqvcUukwZyfZp8Pcm6G_3bk46q2Pjes6E1y_i7rATHIiJUvkxydJxrlkUpEEvv8PvO7TsekKXRCalks7JYgcoGZIHgyu1TeD35rhtyZY70PT-9D0PjR9DC1pPhwHm9iYrk2WNz4-CinBLJlSJO7dgfPOucc2l4pLztk_RZeZrQ</recordid><startdate>20081201</startdate><enddate>20081201</enddate><creator>Kossel, M.</creator><creator>Menolfi, C.</creator><creator>Weiss, J.</creator><creator>Buchmann, P.</creator><creator>von Bueren, G.</creator><creator>Rodoni, L.</creator><creator>Morf, T.</creator><creator>Toifl, T.</creator><creator>Schmatz, M.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope><scope>F28</scope><scope>FR3</scope></search><sort><creationdate>20081201</creationdate><title>A T-Coil-Enhanced 8.5 Gb/s High-Swing SST Transmitter in 65 nm Bulk CMOS With ≪ -16 dB Return Loss Over 10 GHz Bandwidth</title><author>Kossel, M. ; Menolfi, C. ; Weiss, J. ; Buchmann, P. ; von Bueren, G. ; Rodoni, L. ; Morf, T. ; Toifl, T. ; Schmatz, M.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c385t-3db4ad253841721f90f2d24998b55776260255233cdbeb53e1f4825487d26e043</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2008</creationdate><topic>Applied sciences</topic><topic>Circuit properties</topic><topic>Circuits</topic><topic>Clocks</topic><topic>CMOS technology</topic><topic>De-emphasis</topic><topic>Design. Technologies. Operation analysis. Testing</topic><topic>Electric, optical and optoelectronic circuits</topic><topic>Electronic circuits</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>Finite impulse response filter</topic><topic>Frequency filters</topic><topic>Guidelines</topic><topic>Image restoration</topic><topic>Impedance</topic><topic>impedance tuning</topic><topic>Integrated circuits</topic><topic>Propagation losses</topic><topic>return loss</topic><topic>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</topic><topic>source series termination</topic><topic>T-coil</topic><topic>Transmitters</topic><topic>Voltage</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Kossel, M.</creatorcontrib><creatorcontrib>Menolfi, C.</creatorcontrib><creatorcontrib>Weiss, J.</creatorcontrib><creatorcontrib>Buchmann, P.</creatorcontrib><creatorcontrib>von Bueren, G.</creatorcontrib><creatorcontrib>Rodoni, L.</creatorcontrib><creatorcontrib>Morf, T.</creatorcontrib><creatorcontrib>Toifl, T.</creatorcontrib><creatorcontrib>Schmatz, M.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><jtitle>IEEE journal of solid-state circuits</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Kossel, M.</au><au>Menolfi, C.</au><au>Weiss, J.</au><au>Buchmann, P.</au><au>von Bueren, G.</au><au>Rodoni, L.</au><au>Morf, T.</au><au>Toifl, T.</au><au>Schmatz, M.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>A T-Coil-Enhanced 8.5 Gb/s High-Swing SST Transmitter in 65 nm Bulk CMOS With ≪ -16 dB Return Loss Over 10 GHz Bandwidth</atitle><jtitle>IEEE journal of solid-state circuits</jtitle><stitle>JSSC</stitle><date>2008-12-01</date><risdate>2008</risdate><volume>43</volume><issue>12</issue><spage>2905</spage><epage>2920</epage><pages>2905-2920</pages><issn>0018-9200</issn><eissn>1558-173X</eissn><coden>IJSCBC</coden><abstract>A source-series-terminated (SST) transmitter in a 65 nm bulk CMOS technology is presented. The circuit exhibits an eye height greater than 1.0 V for data rates of up to 8.5 Gb/s. A thin-oxide pre-driver stage running at 1.0 V drives 22 parallel connected thick-oxide SST output stages operated at 1.5 V that feature a 5-bit 2-tap FIR filter whose adaptation is independent of the impedance tuning. To achieve a return loss of <-16 dB up to 10 GHz a 40 mum times 40 mum T-coil complements the transmitter output. This half-bit-rate clock SST transmitter has a duty-cycle restoration capability of 5x, and the common-mode voltage noise is below 10 mV rms for high-, mid- and low-level terminations. The chip consumes 96 mW at 8.5 Gb/s and occupies 180 mum times 360 mum. In addition to the transmitter design, guidelines for the T-coil design are presented.</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/JSSC.2008.2006230</doi><tpages>16</tpages></addata></record> |
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| identifier | ISSN: 0018-9200 |
| ispartof | IEEE journal of solid-state circuits, 2008-12, Vol.43 (12), p.2905-2920 |
| issn | 0018-9200 1558-173X |
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| subjects | Applied sciences Circuit properties Circuits Clocks CMOS technology De-emphasis Design. Technologies. Operation analysis. Testing Electric, optical and optoelectronic circuits Electronic circuits Electronics Exact sciences and technology Finite impulse response filter Frequency filters Guidelines Image restoration Impedance impedance tuning Integrated circuits Propagation losses return loss Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices source series termination T-coil Transmitters Voltage |
| title | A T-Coil-Enhanced 8.5 Gb/s High-Swing SST Transmitter in 65 nm Bulk CMOS With ≪ -16 dB Return Loss Over 10 GHz Bandwidth |
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