A novel test environment for template based QDI asynchronous circuits

In this paper, we propose an efficient test environment for template based asynchronous circuits. This test environment consists of two major parts: fault simulation and test pattern generation. The fault simulation is based on exploring fault effect on quasi-delay insensitive asynchronous circuits...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Salehpour, A.-A., Zamani, M., Rahmani, A.-M., Mohammadi, S., Pedram, H., Marvasti, M.B.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Asynchronous circuits Circuit faults Circuit simulation Circuit testing Clocks Computational modeling Delay Electrical fault detection Fault detection Test pattern generators
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