A fully integrated pulsed-LASER time-of-flight measurement system with 12ps single-shot precision
A monolithic pulsed time-of-flight measurement system is presented in this paper. The circuit consists of an optical receiver front-end and time-to-digital converter. Received pulse amplitude detectors are also included to correct measurement for walk error. The IC is fabricated in a 0.18-mum BiCMOS...
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| creator | Copani, T. Vermeire, B. Jain, A. Karaki, H. Chandrashekar, K. Goswami, S. Kitchen, J. Chung, H.H. Deligoz, I. Bakkaloglu, B. Barnaby, H. Kiaei, S. |
| description | A monolithic pulsed time-of-flight measurement system is presented in this paper. The circuit consists of an optical receiver front-end and time-to-digital converter. Received pulse amplitude detectors are also included to correct measurement for walk error. The IC is fabricated in a 0.18-mum BiCMOS process. The receiver front-end achieves a 2.3 GHz bandwidth and NF lower than 5 dB. The system shows a single-shot precision of 12 ps and a measurement range of 188 mus. The measurement rate can be as high as 700 kHz. The power consumption is 148 mA from a 3.5 V supply for analog and E 2 CL circuitry, and a 1.8 V supply for CMOS circuitry. |
| doi_str_mv | 10.1109/CICC.2008.4672096 |
| format | Conference Proceeding |
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The circuit consists of an optical receiver front-end and time-to-digital converter. Received pulse amplitude detectors are also included to correct measurement for walk error. The IC is fabricated in a 0.18-mum BiCMOS process. The receiver front-end achieves a 2.3 GHz bandwidth and NF lower than 5 dB. The system shows a single-shot precision of 12 ps and a measurement range of 188 mus. The measurement rate can be as high as 700 kHz. The power consumption is 148 mA from a 3.5 V supply for analog and E 2 CL circuitry, and a 1.8 V supply for CMOS circuitry.</description><identifier>ISSN: 0886-5930</identifier><identifier>ISBN: 9781424420186</identifier><identifier>ISBN: 1424420180</identifier><identifier>EISSN: 2152-3630</identifier><identifier>EISBN: 9781424420193</identifier><identifier>EISBN: 1424420199</identifier><identifier>DOI: 10.1109/CICC.2008.4672096</identifier><identifier>LCCN: 85-653738</identifier><language>eng</language><publisher>IEEE</publisher><subject>Bandwidth ; BiCMOS integrated circuits ; Detectors ; Energy consumption ; Error correction ; Integrated circuit measurements ; Noise measurement ; Optical pulses ; Optical receivers ; Pulse measurements</subject><ispartof>2008 IEEE Custom Integrated Circuits Conference, 2008, p.359-362</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/4672096$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2056,27924,54919</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/4672096$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Copani, T.</creatorcontrib><creatorcontrib>Vermeire, B.</creatorcontrib><creatorcontrib>Jain, A.</creatorcontrib><creatorcontrib>Karaki, H.</creatorcontrib><creatorcontrib>Chandrashekar, K.</creatorcontrib><creatorcontrib>Goswami, S.</creatorcontrib><creatorcontrib>Kitchen, J.</creatorcontrib><creatorcontrib>Chung, H.H.</creatorcontrib><creatorcontrib>Deligoz, I.</creatorcontrib><creatorcontrib>Bakkaloglu, B.</creatorcontrib><creatorcontrib>Barnaby, H.</creatorcontrib><creatorcontrib>Kiaei, S.</creatorcontrib><title>A fully integrated pulsed-LASER time-of-flight measurement system with 12ps single-shot precision</title><title>2008 IEEE Custom Integrated Circuits Conference</title><addtitle>CICC</addtitle><description>A monolithic pulsed time-of-flight measurement system is presented in this paper. The circuit consists of an optical receiver front-end and time-to-digital converter. Received pulse amplitude detectors are also included to correct measurement for walk error. The IC is fabricated in a 0.18-mum BiCMOS process. The receiver front-end achieves a 2.3 GHz bandwidth and NF lower than 5 dB. The system shows a single-shot precision of 12 ps and a measurement range of 188 mus. The measurement rate can be as high as 700 kHz. The power consumption is 148 mA from a 3.5 V supply for analog and E 2 CL circuitry, and a 1.8 V supply for CMOS circuitry.</description><subject>Bandwidth</subject><subject>BiCMOS integrated circuits</subject><subject>Detectors</subject><subject>Energy consumption</subject><subject>Error correction</subject><subject>Integrated circuit measurements</subject><subject>Noise measurement</subject><subject>Optical pulses</subject><subject>Optical receivers</subject><subject>Pulse measurements</subject><issn>0886-5930</issn><issn>2152-3630</issn><isbn>9781424420186</isbn><isbn>1424420180</isbn><isbn>9781424420193</isbn><isbn>1424420199</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2008</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNpVkMlqwzAURdUhUDfNB5Ru9ANK9fSsaRlMh0Cg0GEdHPs5UbEdYymU_H0DzaaruzjcA_cydg9yDiD9Y7EsirmS0s1zY5X05oLNvHWQqzxXEjxeskyBVgINyqt_zJlrlknnjNAe5YRlTguj0aK7YbcxfstT3TuVsXLBm0PbHnnoE23HMlHNh0MbqRarxcfTO0-hI7FvRNOG7S7xjsp4GKmjPvF4jIk6_hPSjoMaIo-h37Yk4m6f-DBSFWLY93ds0pQn4eycU_b1_PRZvIrV28uyWKxEAKuT0FB5Y8mR1LaECk9LaINyo_PaWDSVIqdqTZXyCsAoLHWtATYEtdENosMpe_jzBiJaD2PoyvG4Pj-Hv5plWxQ</recordid><startdate>200809</startdate><enddate>200809</enddate><creator>Copani, T.</creator><creator>Vermeire, B.</creator><creator>Jain, A.</creator><creator>Karaki, H.</creator><creator>Chandrashekar, K.</creator><creator>Goswami, S.</creator><creator>Kitchen, J.</creator><creator>Chung, H.H.</creator><creator>Deligoz, I.</creator><creator>Bakkaloglu, B.</creator><creator>Barnaby, H.</creator><creator>Kiaei, S.</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope></search><sort><creationdate>200809</creationdate><title>A fully integrated pulsed-LASER time-of-flight measurement system with 12ps single-shot precision</title><author>Copani, T. ; Vermeire, B. ; Jain, A. ; Karaki, H. ; Chandrashekar, K. ; Goswami, S. ; Kitchen, J. ; Chung, H.H. ; Deligoz, I. ; Bakkaloglu, B. ; Barnaby, H. ; Kiaei, S.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i175t-51c967e8e057a1c3142eb30b54d6736c2e82d5ec29211623a5d511be1d65f3383</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2008</creationdate><topic>Bandwidth</topic><topic>BiCMOS integrated circuits</topic><topic>Detectors</topic><topic>Energy consumption</topic><topic>Error correction</topic><topic>Integrated circuit measurements</topic><topic>Noise measurement</topic><topic>Optical pulses</topic><topic>Optical receivers</topic><topic>Pulse measurements</topic><toplevel>online_resources</toplevel><creatorcontrib>Copani, T.</creatorcontrib><creatorcontrib>Vermeire, B.</creatorcontrib><creatorcontrib>Jain, A.</creatorcontrib><creatorcontrib>Karaki, H.</creatorcontrib><creatorcontrib>Chandrashekar, K.</creatorcontrib><creatorcontrib>Goswami, S.</creatorcontrib><creatorcontrib>Kitchen, J.</creatorcontrib><creatorcontrib>Chung, H.H.</creatorcontrib><creatorcontrib>Deligoz, I.</creatorcontrib><creatorcontrib>Bakkaloglu, B.</creatorcontrib><creatorcontrib>Barnaby, H.</creatorcontrib><creatorcontrib>Kiaei, S.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Copani, T.</au><au>Vermeire, B.</au><au>Jain, A.</au><au>Karaki, H.</au><au>Chandrashekar, K.</au><au>Goswami, S.</au><au>Kitchen, J.</au><au>Chung, H.H.</au><au>Deligoz, I.</au><au>Bakkaloglu, B.</au><au>Barnaby, H.</au><au>Kiaei, S.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>A fully integrated pulsed-LASER time-of-flight measurement system with 12ps single-shot precision</atitle><btitle>2008 IEEE Custom Integrated Circuits Conference</btitle><stitle>CICC</stitle><date>2008-09</date><risdate>2008</risdate><spage>359</spage><epage>362</epage><pages>359-362</pages><issn>0886-5930</issn><eissn>2152-3630</eissn><isbn>9781424420186</isbn><isbn>1424420180</isbn><eisbn>9781424420193</eisbn><eisbn>1424420199</eisbn><abstract>A monolithic pulsed time-of-flight measurement system is presented in this paper. The circuit consists of an optical receiver front-end and time-to-digital converter. Received pulse amplitude detectors are also included to correct measurement for walk error. The IC is fabricated in a 0.18-mum BiCMOS process. The receiver front-end achieves a 2.3 GHz bandwidth and NF lower than 5 dB. The system shows a single-shot precision of 12 ps and a measurement range of 188 mus. The measurement rate can be as high as 700 kHz. The power consumption is 148 mA from a 3.5 V supply for analog and E 2 CL circuitry, and a 1.8 V supply for CMOS circuitry.</abstract><pub>IEEE</pub><doi>10.1109/CICC.2008.4672096</doi><tpages>4</tpages></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | ISSN: 0886-5930 |
| ispartof | 2008 IEEE Custom Integrated Circuits Conference, 2008, p.359-362 |
| issn | 0886-5930 2152-3630 |
| language | eng |
| recordid | cdi_ieee_primary_4672096 |
| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Bandwidth BiCMOS integrated circuits Detectors Energy consumption Error correction Integrated circuit measurements Noise measurement Optical pulses Optical receivers Pulse measurements |
| title | A fully integrated pulsed-LASER time-of-flight measurement system with 12ps single-shot precision |
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