Fault detection and visualization through micron-resolution X-ray imaging

This paper describes a novel, non-intrusive method for the detection of faults within printed circuit boards (PCBs) and their components using digital imaging and image analysis techniques. High-resolution X-ray imaging systems provide a means to detect and analyze failures and degradations down to...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Cicchiani, J.A., Hartmuller, T.L., Sell, C.M., Wright, R.G.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	automatic defect recognition Circuit faults circuit test Integrated circuits non-destructive testing PCB test Pixel Printed circuits Transistors Wire X-ray X-ray imaging
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!