Defining a measure for the immunity of analogue to digital converters exposed to electric fields

The paper describes a method to measure the error in samples of an analogue to digital converter when exposed to RFI. Rather than defining a change from an undisturbed value as an error alone, we will show that both psilaordinarypsila bit errors as well as the shape of the histogram around the undis...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Aurand, T., Dawson, J.F., Robinson, M.P., Marvin, A.C.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	ADC analogue to digital converter Converters Histograms IEC 62132 Immunity Integrated circuits Interference Measurement uncertainty Probability density function Shape Statistics
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