Defining a measure for the immunity of analogue to digital converters exposed to electric fields

The paper describes a method to measure the error in samples of an analogue to digital converter when exposed to RFI. Rather than defining a change from an undisturbed value as an error alone, we will show that both psilaordinarypsila bit errors as well as the shape of the histogram around the undis...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Hauptverfasser:	Aurand, T., Dawson, J.F., Robinson, M.P., Marvin, A.C.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	ADC analogue to digital converter Converters Histograms IEC 62132 Immunity Integrated circuits Interference Measurement uncertainty Probability density function Shape Statistics
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

container_end_page	4
container_issue
container_start_page	1
container_title
container_volume
creator	Aurand, T. Dawson, J.F. Robinson, M.P. Marvin, A.C.
description	The paper describes a method to measure the error in samples of an analogue to digital converter when exposed to RFI. Rather than defining a change from an undisturbed value as an error alone, we will show that both psilaordinarypsila bit errors as well as the shape of the histogram around the undisturbed value can to be taken into account. How these errors can be measured and why the two types have to be dealt with separately is explained.
doi_str_mv	10.1109/ISEMC.2008.4652111
format	Conference Proceeding
fullrecord	<record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_4652111</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>4652111</ieee_id><sourcerecordid>4652111</sourcerecordid><originalsourceid>FETCH-LOGICAL-i90t-2190ea1b6bc4dadf63200ae6f4f8586f9dd92b5c50c966b40299bd4a266a962f3</originalsourceid><addsrcrecordid>eNpV0M1KAzEUBeD4U7DUeQHd5AWmJplMzF1KbbVQcWEX7mpmcjNG5qckqdi3t2IRXN3FB-dwLiFXnE05Z3CzfJk_zaaCMT2VqhSc8xOSwa3mUkjJFWh-SsaClzo_kD77Z6DP_4y9jshYF7mSpZRwQbIYPxhjhwoFBR-Tt3t0vvd9Qw3t0MRdQOqGQNM7Ut91u96nPR0cNb1ph2aHNA3U-sYn09J66D8xJAyR4td2iGh_FFusU_A1dR5bGy_JyJk2Yna8E7JezNezx3z1_LCc3a1yDyzlggNDwytV1dIa61RxmG5QOel0qZUDa0FUZV2yGpSqJBMAlZVGKGVACVdMyPVvrEfEzTb4zoT95vi64hvheF0G</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Defining a measure for the immunity of analogue to digital converters exposed to electric fields</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Aurand, T. ; Dawson, J.F. ; Robinson, M.P. ; Marvin, A.C.</creator><creatorcontrib>Aurand, T. ; Dawson, J.F. ; Robinson, M.P. ; Marvin, A.C.</creatorcontrib><description>The paper describes a method to measure the error in samples of an analogue to digital converter when exposed to RFI. Rather than defining a change from an undisturbed value as an error alone, we will show that both psilaordinarypsila bit errors as well as the shape of the histogram around the undisturbed value can to be taken into account. How these errors can be measured and why the two types have to be dealt with separately is explained.</description><identifier>ISSN: 2158-110X</identifier><identifier>ISBN: 9781424416998</identifier><identifier>ISBN: 142441699X</identifier><identifier>EISSN: 2158-1118</identifier><identifier>EISBN: 9781424416981</identifier><identifier>EISBN: 1424416981</identifier><identifier>DOI: 10.1109/ISEMC.2008.4652111</identifier><identifier>LCCN: 83-645449</identifier><language>eng</language><publisher>IEEE</publisher><subject>ADC ; analogue to digital converter ; Converters ; Histograms ; IEC 62132 ; Immunity ; Integrated circuits ; Interference ; Measurement uncertainty ; Probability density function ; Shape ; Statistics</subject><ispartof>2008 IEEE International Symposium on Electromagnetic Compatibility, 2008, p.1-4</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/4652111$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,776,780,785,786,2052,27902,54895</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/4652111$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Aurand, T.</creatorcontrib><creatorcontrib>Dawson, J.F.</creatorcontrib><creatorcontrib>Robinson, M.P.</creatorcontrib><creatorcontrib>Marvin, A.C.</creatorcontrib><title>Defining a measure for the immunity of analogue to digital converters exposed to electric fields</title><title>2008 IEEE International Symposium on Electromagnetic Compatibility</title><addtitle>ISEMC</addtitle><description>The paper describes a method to measure the error in samples of an analogue to digital converter when exposed to RFI. Rather than defining a change from an undisturbed value as an error alone, we will show that both psilaordinarypsila bit errors as well as the shape of the histogram around the undisturbed value can to be taken into account. How these errors can be measured and why the two types have to be dealt with separately is explained.</description><subject>ADC</subject><subject>analogue to digital converter</subject><subject>Converters</subject><subject>Histograms</subject><subject>IEC 62132</subject><subject>Immunity</subject><subject>Integrated circuits</subject><subject>Interference</subject><subject>Measurement uncertainty</subject><subject>Probability density function</subject><subject>Shape</subject><subject>Statistics</subject><issn>2158-110X</issn><issn>2158-1118</issn><isbn>9781424416998</isbn><isbn>142441699X</isbn><isbn>9781424416981</isbn><isbn>1424416981</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2008</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNpV0M1KAzEUBeD4U7DUeQHd5AWmJplMzF1KbbVQcWEX7mpmcjNG5qckqdi3t2IRXN3FB-dwLiFXnE05Z3CzfJk_zaaCMT2VqhSc8xOSwa3mUkjJFWh-SsaClzo_kD77Z6DP_4y9jshYF7mSpZRwQbIYPxhjhwoFBR-Tt3t0vvd9Qw3t0MRdQOqGQNM7Ut91u96nPR0cNb1ph2aHNA3U-sYn09J66D8xJAyR4td2iGh_FFusU_A1dR5bGy_JyJk2Yna8E7JezNezx3z1_LCc3a1yDyzlggNDwytV1dIa61RxmG5QOel0qZUDa0FUZV2yGpSqJBMAlZVGKGVACVdMyPVvrEfEzTb4zoT95vi64hvheF0G</recordid><startdate>200808</startdate><enddate>200808</enddate><creator>Aurand, T.</creator><creator>Dawson, J.F.</creator><creator>Robinson, M.P.</creator><creator>Marvin, A.C.</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope></search><sort><creationdate>200808</creationdate><title>Defining a measure for the immunity of analogue to digital converters exposed to electric fields</title><author>Aurand, T. ; Dawson, J.F. ; Robinson, M.P. ; Marvin, A.C.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i90t-2190ea1b6bc4dadf63200ae6f4f8586f9dd92b5c50c966b40299bd4a266a962f3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2008</creationdate><topic>ADC</topic><topic>analogue to digital converter</topic><topic>Converters</topic><topic>Histograms</topic><topic>IEC 62132</topic><topic>Immunity</topic><topic>Integrated circuits</topic><topic>Interference</topic><topic>Measurement uncertainty</topic><topic>Probability density function</topic><topic>Shape</topic><topic>Statistics</topic><toplevel>online_resources</toplevel><creatorcontrib>Aurand, T.</creatorcontrib><creatorcontrib>Dawson, J.F.</creatorcontrib><creatorcontrib>Robinson, M.P.</creatorcontrib><creatorcontrib>Marvin, A.C.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Aurand, T.</au><au>Dawson, J.F.</au><au>Robinson, M.P.</au><au>Marvin, A.C.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Defining a measure for the immunity of analogue to digital converters exposed to electric fields</atitle><btitle>2008 IEEE International Symposium on Electromagnetic Compatibility</btitle><stitle>ISEMC</stitle><date>2008-08</date><risdate>2008</risdate><spage>1</spage><epage>4</epage><pages>1-4</pages><issn>2158-110X</issn><eissn>2158-1118</eissn><isbn>9781424416998</isbn><isbn>142441699X</isbn><eisbn>9781424416981</eisbn><eisbn>1424416981</eisbn><abstract>The paper describes a method to measure the error in samples of an analogue to digital converter when exposed to RFI. Rather than defining a change from an undisturbed value as an error alone, we will show that both psilaordinarypsila bit errors as well as the shape of the histogram around the undisturbed value can to be taken into account. How these errors can be measured and why the two types have to be dealt with separately is explained.</abstract><pub>IEEE</pub><doi>10.1109/ISEMC.2008.4652111</doi><tpages>4</tpages></addata></record>
fulltext	fulltext_linktorsrc
identifier	ISSN: 2158-110X
ispartof	2008 IEEE International Symposium on Electromagnetic Compatibility, 2008, p.1-4
issn	2158-110X 2158-1118
language	eng
recordid	cdi_ieee_primary_4652111
source	IEEE Electronic Library (IEL) Conference Proceedings
subjects	ADC analogue to digital converter Converters Histograms IEC 62132 Immunity Integrated circuits Interference Measurement uncertainty Probability density function Shape Statistics
title	Defining a measure for the immunity of analogue to digital converters exposed to electric fields
url	https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-05T14%3A32%3A44IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Defining%20a%20measure%20for%20the%20immunity%20of%20analogue%20to%20digital%20converters%20exposed%20to%20electric%20fields&rft.btitle=2008%20IEEE%20International%20Symposium%20on%20Electromagnetic%20Compatibility&rft.au=Aurand,%20T.&rft.date=2008-08&rft.spage=1&rft.epage=4&rft.pages=1-4&rft.issn=2158-110X&rft.eissn=2158-1118&rft.isbn=9781424416998&rft.isbn_list=142441699X&rft_id=info:doi/10.1109/ISEMC.2008.4652111&rft_dat=%3Cieee_6IE%3E4652111%3C/ieee_6IE%3E%3Curl%3E%3C/url%3E&rft.eisbn=9781424416981&rft.eisbn_list=1424416981&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=4652111&rfr_iscdi=true