Investigation of conducted immunity and spatial distribution of RF currents for a 2-sided PCB
Influence of the RF noise in automotive 12-volts power distribution network and its impact on electronic control unit is investigated. A magnetic near-field scanner is used to inspect the penetration of the injected RF currents on an automotive module. Spectral and spatial scans are useful in invest...
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| description | Influence of the RF noise in automotive 12-volts power distribution network and its impact on electronic control unit is investigated. A magnetic near-field scanner is used to inspect the penetration of the injected RF currents on an automotive module. Spectral and spatial scans are useful in investigation of the power distribution robustness. It is anticipated that spatial view of conducted RF currents in a printed circuit board can result into design practices that enhances the EMI robustness of a product and its functional quality. |
| doi_str_mv | 10.1109/ISEMC.2008.4652019 |
| format | Conference Proceeding |
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A magnetic near-field scanner is used to inspect the penetration of the injected RF currents on an automotive module. Spectral and spatial scans are useful in investigation of the power distribution robustness. It is anticipated that spatial view of conducted RF currents in a printed circuit board can result into design practices that enhances the EMI robustness of a product and its functional quality.</description><subject>Automotive engineering</subject><subject>Capacitors</subject><subject>Conducted Immunity (CI)</subject><subject>Direct RF Injection (DRFI)</subject><subject>Electromagnetic compatibility</subject><subject>EMSCAN</subject><subject>Immunity testing</subject><subject>Microcontrollers</subject><subject>Near Field Magnetic probe</subject><subject>Radio frequency</subject><subject>TEM Cell Radiated Immunity</subject><subject>Transient analysis</subject><subject>Transient Waveforms</subject><issn>2158-110X</issn><issn>2158-1118</issn><isbn>9781424416998</isbn><isbn>142441699X</isbn><isbn>9781424416981</isbn><isbn>1424416981</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2008</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNpVkMtKAzEYheOlYKnzArrJC0zNn9skSx1aLVQU7cKNlNxGIu1MmWSEvr0Fq-DqLL5zgYPQFZApANE3i9fZYz2lhKgpl4IS0Ceo0JUCTjkHqRWcojEFoUoAUGf_mFbnf4y8jdBYsVJywbm-QEVKn4SQw4TUDMbofdF-hZTjh8mxa3HXYNe1fnA5eBy326GNeY9N63HaHRxmg31MuY92-LW_zLEb-j60OeGm67HBtEzRH-LP9d0lGjVmk0Jx1AlazWer-qFcPt0v6ttlGTXJpZBEcA8WIDBPpRKV0cxJJyWVobLgvNUAogFFLeHaEwqMam-5V1YJ5dgEXf_UxhDCetfHren36-Nv7BscvFop</recordid><startdate>200808</startdate><enddate>200808</enddate><creator>Rostamzadeh, C.</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope></search><sort><creationdate>200808</creationdate><title>Investigation of conducted immunity and spatial distribution of RF currents for a 2-sided PCB</title><author>Rostamzadeh, C.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i90t-56054d1b11e3d26857a93c6c6626e7b1cdb9115f182b049d021329db4d8b858c3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2008</creationdate><topic>Automotive engineering</topic><topic>Capacitors</topic><topic>Conducted Immunity (CI)</topic><topic>Direct RF Injection (DRFI)</topic><topic>Electromagnetic compatibility</topic><topic>EMSCAN</topic><topic>Immunity testing</topic><topic>Microcontrollers</topic><topic>Near Field Magnetic probe</topic><topic>Radio frequency</topic><topic>TEM Cell Radiated Immunity</topic><topic>Transient analysis</topic><topic>Transient Waveforms</topic><toplevel>online_resources</toplevel><creatorcontrib>Rostamzadeh, C.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Rostamzadeh, C.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Investigation of conducted immunity and spatial distribution of RF currents for a 2-sided PCB</atitle><btitle>2008 IEEE International Symposium on Electromagnetic Compatibility</btitle><stitle>ISEMC</stitle><date>2008-08</date><risdate>2008</risdate><spage>1</spage><epage>5</epage><pages>1-5</pages><issn>2158-110X</issn><eissn>2158-1118</eissn><isbn>9781424416998</isbn><isbn>142441699X</isbn><eisbn>9781424416981</eisbn><eisbn>1424416981</eisbn><abstract>Influence of the RF noise in automotive 12-volts power distribution network and its impact on electronic control unit is investigated. A magnetic near-field scanner is used to inspect the penetration of the injected RF currents on an automotive module. Spectral and spatial scans are useful in investigation of the power distribution robustness. It is anticipated that spatial view of conducted RF currents in a printed circuit board can result into design practices that enhances the EMI robustness of a product and its functional quality.</abstract><pub>IEEE</pub><doi>10.1109/ISEMC.2008.4652019</doi><tpages>5</tpages></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | ISSN: 2158-110X |
| ispartof | 2008 IEEE International Symposium on Electromagnetic Compatibility, 2008, p.1-5 |
| issn | 2158-110X 2158-1118 |
| language | eng |
| recordid | cdi_ieee_primary_4652019 |
| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Automotive engineering Capacitors Conducted Immunity (CI) Direct RF Injection (DRFI) Electromagnetic compatibility EMSCAN Immunity testing Microcontrollers Near Field Magnetic probe Radio frequency TEM Cell Radiated Immunity Transient analysis Transient Waveforms |
| title | Investigation of conducted immunity and spatial distribution of RF currents for a 2-sided PCB |
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