Electron ejection processes at insulator-semiconductor interfaces in ACTFEL display devices

Luminance, conduction current and threshold voltage of ZnS:Mn ac thin film electroluminescent display devices were measured as functions of device temperature (10 K-300 K) and risetime of the excitation voltage pulse (2 /spl mu/s-50 /spl mu/s). Results provided insight into the electron ejection mec...

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Veröffentlicht in:	IEEE transactions on electron devices 1995-10, Vol.42 (10), p.1756-1762
Hauptverfasser:	Bhaskaran, S., Singh, V.P., Morton, D.C.
Format:	Artikel
Sprache:	eng
Schlagworte:	Current measurement Displays Electroluminescent devices Electrons Insulation Pulse measurements Temperature Thin film devices Threshold voltage Tunneling
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