Proposal of an industrial information system model for automatic performance evaluation
The purpose of this paper is to present an approach for the performance analysis of manufacturing processes based on information gathering in a Factory Information System (FIS). It makes use of the overall equipment efficiency (OEE) index for measuring the efficiency of the process and used resource...
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creator | Santos, E.A.P. De Freitas Rocha Loures, E. Deschamps, F. De Paula, M.A.B. |
description | The purpose of this paper is to present an approach for the performance analysis of manufacturing processes based on information gathering in a Factory Information System (FIS). It makes use of the overall equipment efficiency (OEE) index for measuring the efficiency of the process and used resources, such as machines. Information analysis in such a system must be carried out dynamically. With this in mind, colored Petri nets (CPN), which model the information flow for a FIS are used. The CPN models are built on a conceptual architecture of a FIS system, used to explore data integration and manipulation. The obtained models represent the necessary information flow for data acquisition from machines for performance indexes such as OEE to be calculated and stored in a conceptual architecture as described. The proposed model is yet to be implemented in a hardware module in order to test its effectiveness. |
doi_str_mv | 10.1109/ETFA.2008.4638430 |
format | Conference Proceeding |
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The proposed model is yet to be implemented in a hardware module in order to test its effectiveness.</description><subject>Data models</subject><subject>Indexes</subject><subject>Information systems</subject><subject>Integration</subject><subject>Manufacturing</subject><subject>Manufacturing Systems</subject><subject>OEE</subject><subject>Petri nets</subject><subject>Production</subject><subject>Semiconductor device measurement</subject><issn>1946-0740</issn><issn>1946-0759</issn><isbn>9781424415052</isbn><isbn>1424415055</isbn><isbn>1424415063</isbn><isbn>9781424415069</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2008</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNo9kMtqwzAQRdVHoEnqDyjd6Aecjjx6WMsQkrYQaBcpXQbZlkDFtozlFPL3ddK0q4F77hyGIeSBwYIx0E_r3Wa5yADyBZeYc4QrMmM845wJkHhNpkxzmYIS-oYkWuV_TGS3_4zDhMxGh9LAFYg7ksT4BQCjX2rUU_L53ocuRFPT4KhpqW-rQxx6Pwa-daFvzOBDS-MxDrahTahsTceYmsMQTqykne3Pvba01H6b-nDeuCcTZ-pok8uck4_Nerd6Sbdvz6-r5Tb1TIkhLcazpCiMBSULXUhbCa2tQ44GQaPLSsdEJpBzVTosdMmKKpeIFQAXVVbinDz-er21dt_1vjH9cX95GP4A7V1Zhg</recordid><startdate>200809</startdate><enddate>200809</enddate><creator>Santos, E.A.P.</creator><creator>De Freitas Rocha Loures, E.</creator><creator>Deschamps, F.</creator><creator>De Paula, M.A.B.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>200809</creationdate><title>Proposal of an industrial information system model for automatic performance evaluation</title><author>Santos, E.A.P. ; De Freitas Rocha Loures, E. ; Deschamps, F. ; De Paula, M.A.B.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i175t-b04765bae076b9b6ed599ef343a3093f2cf15253447cf3b9c1bd8633d0045d2c3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2008</creationdate><topic>Data models</topic><topic>Indexes</topic><topic>Information systems</topic><topic>Integration</topic><topic>Manufacturing</topic><topic>Manufacturing Systems</topic><topic>OEE</topic><topic>Petri nets</topic><topic>Production</topic><topic>Semiconductor device measurement</topic><toplevel>online_resources</toplevel><creatorcontrib>Santos, E.A.P.</creatorcontrib><creatorcontrib>De Freitas Rocha Loures, E.</creatorcontrib><creatorcontrib>Deschamps, F.</creatorcontrib><creatorcontrib>De Paula, M.A.B.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Santos, E.A.P.</au><au>De Freitas Rocha Loures, E.</au><au>Deschamps, F.</au><au>De Paula, M.A.B.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Proposal of an industrial information system model for automatic performance evaluation</atitle><btitle>2008 IEEE International Conference on Emerging Technologies and Factory Automation</btitle><stitle>ETFA</stitle><date>2008-09</date><risdate>2008</risdate><spage>436</spage><epage>439</epage><pages>436-439</pages><issn>1946-0740</issn><eissn>1946-0759</eissn><isbn>9781424415052</isbn><isbn>1424415055</isbn><eisbn>1424415063</eisbn><eisbn>9781424415069</eisbn><abstract>The purpose of this paper is to present an approach for the performance analysis of manufacturing processes based on information gathering in a Factory Information System (FIS). It makes use of the overall equipment efficiency (OEE) index for measuring the efficiency of the process and used resources, such as machines. Information analysis in such a system must be carried out dynamically. With this in mind, colored Petri nets (CPN), which model the information flow for a FIS are used. The CPN models are built on a conceptual architecture of a FIS system, used to explore data integration and manipulation. The obtained models represent the necessary information flow for data acquisition from machines for performance indexes such as OEE to be calculated and stored in a conceptual architecture as described. The proposed model is yet to be implemented in a hardware module in order to test its effectiveness.</abstract><pub>IEEE</pub><doi>10.1109/ETFA.2008.4638430</doi><tpages>4</tpages></addata></record> |
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issn | 1946-0740 1946-0759 |
language | eng |
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source | IEEE Electronic Library (IEL) Conference Proceedings |
subjects | Data models Indexes Information systems Integration Manufacturing Manufacturing Systems OEE Petri nets Production Semiconductor device measurement |
title | Proposal of an industrial information system model for automatic performance evaluation |
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