Drain Current Model Including Velocity Saturation for Symmetric Double-Gate MOSFETs
A drain current model is developed for a symmetrically driven undoped (or lightly doped) symmetric double-gate MOSFET (SDGFET) under the drift-diffusion transport mechanism, with velocity saturation effects being included as an integral part of the model derivation. Velocity saturation effects are m...
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Veröffentlicht in: | IEEE transactions on electron devices 2008-08, Vol.55 (8), p.2173-2180 |
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Sprache: | eng |
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