Measurement of Facet Reflectivity Through Reflection Gain in Fabry-PÉrot Laser Diode

Measurement of Facet Reflectivity Through Reflection Gain in Fabry-PÉrot Laser Diode

We propose a simple and useful method to measure the facet reflectivity in a Fabry-Perot laser diode (LD). The new measurement method does not require information on LD parameters such as threshold current or optical spectrum. The measurement is based on a simple formula that describes the relations...

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Veröffentlicht in:IEEE photonics technology letters 2008-07, Vol.20 (14), p.1225-1227
Hauptverfasser: Jeong, Jong Sool, Lee, Hak-Kyu, Lee, Chang-Hee
Format: Artikel
Sprache:eng
Schlagworte:
Coatings
Diode lasers
Fabry-PÉrot laser diode (F-P LD)
facet reflectivity
Gain measurement
Optical coupling
Optical reflection
Probes
reflection gain
Reflectivity
Semiconductor optical amplifiers
Stimulated emission
Threshold current
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container_title IEEE photonics technology letters
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creator Jeong, Jong Sool
Lee, Hak-Kyu
Lee, Chang-Hee
description We propose a simple and useful method to measure the facet reflectivity in a Fabry-Perot laser diode (LD). The new measurement method does not require information on LD parameters such as threshold current or optical spectrum. The measurement is based on a simple formula that describes the relationship of facet reflectivity and reflection gain with launching the probe beam of a narrow spectral width.
doi_str_mv 10.1109/LPT.2008.925508
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subjects Coatings
Diode lasers
Fabry-PÉrot laser diode (F-P LD)
facet reflectivity
Gain measurement
Optical coupling
Optical reflection
Probes
reflection gain
Reflectivity
Semiconductor optical amplifiers
Stimulated emission
Threshold current
title Measurement of Facet Reflectivity Through Reflection Gain in Fabry-PÉrot Laser Diode
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