Performance comparison between copper, carbon nanotube, and optical interconnects
The interconnect bottleneck presents a compelling reason to explore novel interconnect architectures. In this work, we have quantified and compared the performance of two promising interconnects: carbon nanotube (CNT) and optical interconnects with the scaled Cu/low-k on-chip and off-chip interconne...
Gespeichert in:
Hauptverfasser: | , , , |
---|---|
Format: | Tagungsbericht |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | 2784 |
---|---|
container_issue | |
container_start_page | 2781 |
container_title | |
container_volume | |
creator | Saraswat, Krishna Hoyeol Cho Kapur, Pawan Kyung-Hoae Koo |
description | The interconnect bottleneck presents a compelling reason to explore novel interconnect architectures. In this work, we have quantified and compared the performance of two promising interconnects: carbon nanotube (CNT) and optical interconnects with the scaled Cu/low-k on-chip and off-chip interconnects for future high-performance ICs. |
doi_str_mv | 10.1109/ISCAS.2008.4542034 |
format | Conference Proceeding |
fullrecord | <record><control><sourceid>proquest_6IE</sourceid><recordid>TN_cdi_ieee_primary_4542034</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>4542034</ieee_id><sourcerecordid>34526570</sourcerecordid><originalsourceid>FETCH-LOGICAL-i206t-73dc908322cf5a07fbb3f6d19ca30c6568e842052c6bfdc5648acc60c1f863db3</originalsourceid><addsrcrecordid>eNo1UEtLw0AYXB8FY-0f0EtOnpq672yOpfgoFFSq57D58gUiyW7cTRH_vYHWuQzMDAMzhNwyumKMFg_b_Wa9X3FKzUoqyamQZ-SaSS4l00ayc5JwpkzGFFcXZFHk5t8T-SVJKM9ZJgXlM5IYmmmplaBXZBHjF50gleCKJ-T9DUPjQ28dYAq-H2xoo3dpheMPopukYcCwTMGGapKddX48VLhMratTP4wt2C5t3YgBvHMIY7whs8Z2ERcnnpPPp8ePzUu2e33ebta7rOVUj1kuaiioEZxDoyzNm6oSja5ZAVZQ0EobNNNoxUFXTQ1KS2MBNAXWGC3qSszJ_bF3CP77gHEs-zYCdp116A-xFFJxrXI6Be-OwRYRyyG0vQ2_5elS8QeYLmSW</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype><pqid>34526570</pqid></control><display><type>conference_proceeding</type><title>Performance comparison between copper, carbon nanotube, and optical interconnects</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Saraswat, Krishna ; Hoyeol Cho ; Kapur, Pawan ; Kyung-Hoae Koo</creator><creatorcontrib>Saraswat, Krishna ; Hoyeol Cho ; Kapur, Pawan ; Kyung-Hoae Koo</creatorcontrib><description>The interconnect bottleneck presents a compelling reason to explore novel interconnect architectures. In this work, we have quantified and compared the performance of two promising interconnects: carbon nanotube (CNT) and optical interconnects with the scaled Cu/low-k on-chip and off-chip interconnects for future high-performance ICs.</description><identifier>ISSN: 0271-4302</identifier><identifier>ISBN: 9781424416837</identifier><identifier>ISBN: 1424416833</identifier><identifier>EISSN: 2158-1525</identifier><identifier>EISBN: 1424416841</identifier><identifier>EISBN: 9781424416844</identifier><identifier>DOI: 10.1109/ISCAS.2008.4542034</identifier><identifier>LCCN: 80-646530</identifier><language>eng</language><publisher>IEEE</publisher><subject>Bandwidth ; Carbon nanotubes ; Conductivity ; Copper ; Delay ; Inductance ; Integrated circuit interconnections ; Optical interconnections ; Optical scattering ; Wire</subject><ispartof>2008 IEEE International Symposium on Circuits and Systems, 2008, p.2781-2784</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/4542034$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,314,777,781,786,787,2052,27905,27906,54901</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/4542034$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Saraswat, Krishna</creatorcontrib><creatorcontrib>Hoyeol Cho</creatorcontrib><creatorcontrib>Kapur, Pawan</creatorcontrib><creatorcontrib>Kyung-Hoae Koo</creatorcontrib><title>Performance comparison between copper, carbon nanotube, and optical interconnects</title><title>2008 IEEE International Symposium on Circuits and Systems</title><addtitle>ISCAS</addtitle><description>The interconnect bottleneck presents a compelling reason to explore novel interconnect architectures. In this work, we have quantified and compared the performance of two promising interconnects: carbon nanotube (CNT) and optical interconnects with the scaled Cu/low-k on-chip and off-chip interconnects for future high-performance ICs.</description><subject>Bandwidth</subject><subject>Carbon nanotubes</subject><subject>Conductivity</subject><subject>Copper</subject><subject>Delay</subject><subject>Inductance</subject><subject>Integrated circuit interconnections</subject><subject>Optical interconnections</subject><subject>Optical scattering</subject><subject>Wire</subject><issn>0271-4302</issn><issn>2158-1525</issn><isbn>9781424416837</isbn><isbn>1424416833</isbn><isbn>1424416841</isbn><isbn>9781424416844</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2008</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNo1UEtLw0AYXB8FY-0f0EtOnpq672yOpfgoFFSq57D58gUiyW7cTRH_vYHWuQzMDAMzhNwyumKMFg_b_Wa9X3FKzUoqyamQZ-SaSS4l00ayc5JwpkzGFFcXZFHk5t8T-SVJKM9ZJgXlM5IYmmmplaBXZBHjF50gleCKJ-T9DUPjQ28dYAq-H2xoo3dpheMPopukYcCwTMGGapKddX48VLhMratTP4wt2C5t3YgBvHMIY7whs8Z2ERcnnpPPp8ePzUu2e33ebta7rOVUj1kuaiioEZxDoyzNm6oSja5ZAVZQ0EobNNNoxUFXTQ1KS2MBNAXWGC3qSszJ_bF3CP77gHEs-zYCdp116A-xFFJxrXI6Be-OwRYRyyG0vQ2_5elS8QeYLmSW</recordid><startdate>20080101</startdate><enddate>20080101</enddate><creator>Saraswat, Krishna</creator><creator>Hoyeol Cho</creator><creator>Kapur, Pawan</creator><creator>Kyung-Hoae Koo</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope><scope>7SC</scope><scope>7SP</scope><scope>8FD</scope><scope>JQ2</scope><scope>L7M</scope><scope>L~C</scope><scope>L~D</scope></search><sort><creationdate>20080101</creationdate><title>Performance comparison between copper, carbon nanotube, and optical interconnects</title><author>Saraswat, Krishna ; Hoyeol Cho ; Kapur, Pawan ; Kyung-Hoae Koo</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i206t-73dc908322cf5a07fbb3f6d19ca30c6568e842052c6bfdc5648acc60c1f863db3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2008</creationdate><topic>Bandwidth</topic><topic>Carbon nanotubes</topic><topic>Conductivity</topic><topic>Copper</topic><topic>Delay</topic><topic>Inductance</topic><topic>Integrated circuit interconnections</topic><topic>Optical interconnections</topic><topic>Optical scattering</topic><topic>Wire</topic><toplevel>online_resources</toplevel><creatorcontrib>Saraswat, Krishna</creatorcontrib><creatorcontrib>Hoyeol Cho</creatorcontrib><creatorcontrib>Kapur, Pawan</creatorcontrib><creatorcontrib>Kyung-Hoae Koo</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection><collection>Computer and Information Systems Abstracts</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>ProQuest Computer Science Collection</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Computer and Information Systems Abstracts Academic</collection><collection>Computer and Information Systems Abstracts Professional</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Saraswat, Krishna</au><au>Hoyeol Cho</au><au>Kapur, Pawan</au><au>Kyung-Hoae Koo</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Performance comparison between copper, carbon nanotube, and optical interconnects</atitle><btitle>2008 IEEE International Symposium on Circuits and Systems</btitle><stitle>ISCAS</stitle><date>2008-01-01</date><risdate>2008</risdate><spage>2781</spage><epage>2784</epage><pages>2781-2784</pages><issn>0271-4302</issn><eissn>2158-1525</eissn><isbn>9781424416837</isbn><isbn>1424416833</isbn><eisbn>1424416841</eisbn><eisbn>9781424416844</eisbn><abstract>The interconnect bottleneck presents a compelling reason to explore novel interconnect architectures. In this work, we have quantified and compared the performance of two promising interconnects: carbon nanotube (CNT) and optical interconnects with the scaled Cu/low-k on-chip and off-chip interconnects for future high-performance ICs.</abstract><pub>IEEE</pub><doi>10.1109/ISCAS.2008.4542034</doi><tpages>4</tpages></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | ISSN: 0271-4302 |
ispartof | 2008 IEEE International Symposium on Circuits and Systems, 2008, p.2781-2784 |
issn | 0271-4302 2158-1525 |
language | eng |
recordid | cdi_ieee_primary_4542034 |
source | IEEE Electronic Library (IEL) Conference Proceedings |
subjects | Bandwidth Carbon nanotubes Conductivity Copper Delay Inductance Integrated circuit interconnections Optical interconnections Optical scattering Wire |
title | Performance comparison between copper, carbon nanotube, and optical interconnects |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-17T12%3A47%3A46IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Performance%20comparison%20between%20copper,%20carbon%20nanotube,%20and%20optical%20interconnects&rft.btitle=2008%20IEEE%20International%20Symposium%20on%20Circuits%20and%20Systems&rft.au=Saraswat,%20Krishna&rft.date=2008-01-01&rft.spage=2781&rft.epage=2784&rft.pages=2781-2784&rft.issn=0271-4302&rft.eissn=2158-1525&rft.isbn=9781424416837&rft.isbn_list=1424416833&rft_id=info:doi/10.1109/ISCAS.2008.4542034&rft_dat=%3Cproquest_6IE%3E34526570%3C/proquest_6IE%3E%3Curl%3E%3C/url%3E&rft.eisbn=1424416841&rft.eisbn_list=9781424416844&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=34526570&rft_id=info:pmid/&rft_ieee_id=4542034&rfr_iscdi=true |