Self-Triggered SCR in Output Driver for Enhanced ESD Robustness

This paper presents an enhanced ESD (electrostatic discharge) protection solution for output drivers without additional protection devices. The output drivers in low and high voltage CMOS technologies are often susceptible against the ESD stresses with and without the ESD protection devices. The pro...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	TaegHyun Kang, JunHyeong Ryu, MoonHo Kim, EuiYong Chung, Robinson-Hahn, D.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Clamps CMOS technology Electrostatic discharge Low voltage Medium voltage Power semiconductor devices Protection Robustness Stress Thyristors
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