Ionic polarisation layers in polymer electrolytes

When high electrical fields are applied, and especially above the glass transition temperature, ion transport through the epoxy molding compounds that encapsulate the integrated circuit (die) strongly increases, leading to the accumulation of charge at the passivation-epoxy interface, and possibly t...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Biesheuvel, P.M., van Soestbergen, M., Mavinkurve, A., Ernst, L.J., Zhang, G.Q.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 5
container_issue
container_start_page 1
container_title
container_volume
creator Biesheuvel, P.M.
van Soestbergen, M.
Mavinkurve, A.
Ernst, L.J.
Zhang, G.Q.
description When high electrical fields are applied, and especially above the glass transition temperature, ion transport through the epoxy molding compounds that encapsulate the integrated circuit (die) strongly increases, leading to the accumulation of charge at the passivation-epoxy interface, and possibly to leakage currents because of the formation of parasitic transistors. Recovery from this failure mechanism is possible after annealing the package in the absence of the applied voltage, at sufficiently high temperature. The high electrical fields originate either from within the package due to high-voltage bondpads, 1 or are due to an external high-voltage source. We have developed a numerical transport model that is able to describe ion transport through IC packages including the formation of 'ionic diffuse layers', or 'polarisation layers,' at the passivation-epoxy interface. 3 In these layers the ion concentration strongly increases, leading to a modification of the electrostatic boundary conditions (Gauss' law), as well as to a voltage step over the passivation-epoxy interface. The exact distribution of the ions in this diffuse layer is a very important quantity as it strongly influences the voltage profiles in the bulk of the material via the boundary conditions, and therefore the ion transport rates. We will briefly outline how the relation between charge and voltage (integral capacitance) can be obtained experimentally from the dielectric response when a DC voltage is applied across a thin polymer sample. The data that are obtained can be used to derive realistic microscopic models for the ion distribution in the diffuse layer formed within an epoxy resin next to electrodes and passivation layers.
doi_str_mv 10.1109/ESIME.2008.4525006
format Conference Proceeding
fullrecord <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_4525006</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>4525006</ieee_id><sourcerecordid>4525006</sourcerecordid><originalsourceid>FETCH-LOGICAL-i90t-39b165e0ddde457c36ee204454c6e77b6e8d837902805077b0c7e103001abd0e3</originalsourceid><addsrcrecordid>eNo1j89Kw0AYxFekoG3zAnrJCyR--3_3KCVqoOKhvZfN7iespEnZzSVvb4p1LsP8GAaGkCcKNaVgX5pD-9nUDMDUQjIJoO5IYbWhggnBKDPsnqz_g1Yrsr527dLT8oEUOf_AIiE5V_SR0HYcoi8vY-9SzG6K41D2bsaUyzhc8XzGVGKPfkpLmDBvyerb9RmLm2_I8a057j6q_dd7u3vdV9HCVHHbUSURQggopPZcITIQQgqvUOtOoQmGawvMgIQFgNdIgQNQ1wVAviHPf7MREU-XFM8uzafbY_4LMOpG2A</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Ionic polarisation layers in polymer electrolytes</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Biesheuvel, P.M. ; van Soestbergen, M. ; Mavinkurve, A. ; Ernst, L.J. ; Zhang, G.Q.</creator><creatorcontrib>Biesheuvel, P.M. ; van Soestbergen, M. ; Mavinkurve, A. ; Ernst, L.J. ; Zhang, G.Q.</creatorcontrib><description>When high electrical fields are applied, and especially above the glass transition temperature, ion transport through the epoxy molding compounds that encapsulate the integrated circuit (die) strongly increases, leading to the accumulation of charge at the passivation-epoxy interface, and possibly to leakage currents because of the formation of parasitic transistors. Recovery from this failure mechanism is possible after annealing the package in the absence of the applied voltage, at sufficiently high temperature. The high electrical fields originate either from within the package due to high-voltage bondpads, 1 or are due to an external high-voltage source. We have developed a numerical transport model that is able to describe ion transport through IC packages including the formation of 'ionic diffuse layers', or 'polarisation layers,' at the passivation-epoxy interface. 3 In these layers the ion concentration strongly increases, leading to a modification of the electrostatic boundary conditions (Gauss' law), as well as to a voltage step over the passivation-epoxy interface. The exact distribution of the ions in this diffuse layer is a very important quantity as it strongly influences the voltage profiles in the bulk of the material via the boundary conditions, and therefore the ion transport rates. We will briefly outline how the relation between charge and voltage (integral capacitance) can be obtained experimentally from the dielectric response when a DC voltage is applied across a thin polymer sample. The data that are obtained can be used to derive realistic microscopic models for the ion distribution in the diffuse layer formed within an epoxy resin next to electrodes and passivation layers.</description><identifier>ISBN: 1424421276</identifier><identifier>ISBN: 9781424421275</identifier><identifier>EISBN: 9781424421282</identifier><identifier>EISBN: 1424421284</identifier><identifier>DOI: 10.1109/ESIME.2008.4525006</identifier><identifier>LCCN: 2008900675</identifier><language>eng</language><publisher>IEEE</publisher><subject>Boundary conditions ; Failure analysis ; Glass ; Integrated circuit modeling ; Integrated circuit packaging ; Leakage current ; Polarization ; Polymers ; Temperature ; Voltage</subject><ispartof>EuroSimE 2008 - International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Micro-Systems, 2008, p.1-5</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/4525006$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2058,27925,54920</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/4525006$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Biesheuvel, P.M.</creatorcontrib><creatorcontrib>van Soestbergen, M.</creatorcontrib><creatorcontrib>Mavinkurve, A.</creatorcontrib><creatorcontrib>Ernst, L.J.</creatorcontrib><creatorcontrib>Zhang, G.Q.</creatorcontrib><title>Ionic polarisation layers in polymer electrolytes</title><title>EuroSimE 2008 - International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Micro-Systems</title><addtitle>ESIME</addtitle><description>When high electrical fields are applied, and especially above the glass transition temperature, ion transport through the epoxy molding compounds that encapsulate the integrated circuit (die) strongly increases, leading to the accumulation of charge at the passivation-epoxy interface, and possibly to leakage currents because of the formation of parasitic transistors. Recovery from this failure mechanism is possible after annealing the package in the absence of the applied voltage, at sufficiently high temperature. The high electrical fields originate either from within the package due to high-voltage bondpads, 1 or are due to an external high-voltage source. We have developed a numerical transport model that is able to describe ion transport through IC packages including the formation of 'ionic diffuse layers', or 'polarisation layers,' at the passivation-epoxy interface. 3 In these layers the ion concentration strongly increases, leading to a modification of the electrostatic boundary conditions (Gauss' law), as well as to a voltage step over the passivation-epoxy interface. The exact distribution of the ions in this diffuse layer is a very important quantity as it strongly influences the voltage profiles in the bulk of the material via the boundary conditions, and therefore the ion transport rates. We will briefly outline how the relation between charge and voltage (integral capacitance) can be obtained experimentally from the dielectric response when a DC voltage is applied across a thin polymer sample. The data that are obtained can be used to derive realistic microscopic models for the ion distribution in the diffuse layer formed within an epoxy resin next to electrodes and passivation layers.</description><subject>Boundary conditions</subject><subject>Failure analysis</subject><subject>Glass</subject><subject>Integrated circuit modeling</subject><subject>Integrated circuit packaging</subject><subject>Leakage current</subject><subject>Polarization</subject><subject>Polymers</subject><subject>Temperature</subject><subject>Voltage</subject><isbn>1424421276</isbn><isbn>9781424421275</isbn><isbn>9781424421282</isbn><isbn>1424421284</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2008</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNo1j89Kw0AYxFekoG3zAnrJCyR--3_3KCVqoOKhvZfN7iespEnZzSVvb4p1LsP8GAaGkCcKNaVgX5pD-9nUDMDUQjIJoO5IYbWhggnBKDPsnqz_g1Yrsr527dLT8oEUOf_AIiE5V_SR0HYcoi8vY-9SzG6K41D2bsaUyzhc8XzGVGKPfkpLmDBvyerb9RmLm2_I8a057j6q_dd7u3vdV9HCVHHbUSURQggopPZcITIQQgqvUOtOoQmGawvMgIQFgNdIgQNQ1wVAviHPf7MREU-XFM8uzafbY_4LMOpG2A</recordid><startdate>200804</startdate><enddate>200804</enddate><creator>Biesheuvel, P.M.</creator><creator>van Soestbergen, M.</creator><creator>Mavinkurve, A.</creator><creator>Ernst, L.J.</creator><creator>Zhang, G.Q.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>200804</creationdate><title>Ionic polarisation layers in polymer electrolytes</title><author>Biesheuvel, P.M. ; van Soestbergen, M. ; Mavinkurve, A. ; Ernst, L.J. ; Zhang, G.Q.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i90t-39b165e0ddde457c36ee204454c6e77b6e8d837902805077b0c7e103001abd0e3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2008</creationdate><topic>Boundary conditions</topic><topic>Failure analysis</topic><topic>Glass</topic><topic>Integrated circuit modeling</topic><topic>Integrated circuit packaging</topic><topic>Leakage current</topic><topic>Polarization</topic><topic>Polymers</topic><topic>Temperature</topic><topic>Voltage</topic><toplevel>online_resources</toplevel><creatorcontrib>Biesheuvel, P.M.</creatorcontrib><creatorcontrib>van Soestbergen, M.</creatorcontrib><creatorcontrib>Mavinkurve, A.</creatorcontrib><creatorcontrib>Ernst, L.J.</creatorcontrib><creatorcontrib>Zhang, G.Q.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Biesheuvel, P.M.</au><au>van Soestbergen, M.</au><au>Mavinkurve, A.</au><au>Ernst, L.J.</au><au>Zhang, G.Q.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Ionic polarisation layers in polymer electrolytes</atitle><btitle>EuroSimE 2008 - International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Micro-Systems</btitle><stitle>ESIME</stitle><date>2008-04</date><risdate>2008</risdate><spage>1</spage><epage>5</epage><pages>1-5</pages><isbn>1424421276</isbn><isbn>9781424421275</isbn><eisbn>9781424421282</eisbn><eisbn>1424421284</eisbn><abstract>When high electrical fields are applied, and especially above the glass transition temperature, ion transport through the epoxy molding compounds that encapsulate the integrated circuit (die) strongly increases, leading to the accumulation of charge at the passivation-epoxy interface, and possibly to leakage currents because of the formation of parasitic transistors. Recovery from this failure mechanism is possible after annealing the package in the absence of the applied voltage, at sufficiently high temperature. The high electrical fields originate either from within the package due to high-voltage bondpads, 1 or are due to an external high-voltage source. We have developed a numerical transport model that is able to describe ion transport through IC packages including the formation of 'ionic diffuse layers', or 'polarisation layers,' at the passivation-epoxy interface. 3 In these layers the ion concentration strongly increases, leading to a modification of the electrostatic boundary conditions (Gauss' law), as well as to a voltage step over the passivation-epoxy interface. The exact distribution of the ions in this diffuse layer is a very important quantity as it strongly influences the voltage profiles in the bulk of the material via the boundary conditions, and therefore the ion transport rates. We will briefly outline how the relation between charge and voltage (integral capacitance) can be obtained experimentally from the dielectric response when a DC voltage is applied across a thin polymer sample. The data that are obtained can be used to derive realistic microscopic models for the ion distribution in the diffuse layer formed within an epoxy resin next to electrodes and passivation layers.</abstract><pub>IEEE</pub><doi>10.1109/ESIME.2008.4525006</doi><tpages>5</tpages></addata></record>
fulltext fulltext_linktorsrc
identifier ISBN: 1424421276
ispartof EuroSimE 2008 - International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Micro-Systems, 2008, p.1-5
issn
language eng
recordid cdi_ieee_primary_4525006
source IEEE Electronic Library (IEL) Conference Proceedings
subjects Boundary conditions
Failure analysis
Glass
Integrated circuit modeling
Integrated circuit packaging
Leakage current
Polarization
Polymers
Temperature
Voltage
title Ionic polarisation layers in polymer electrolytes
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-26T20%3A15%3A52IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Ionic%20polarisation%20layers%20in%20polymer%20electrolytes&rft.btitle=EuroSimE%202008%20-%20International%20Conference%20on%20Thermal,%20Mechanical%20and%20Multi-Physics%20Simulation%20and%20Experiments%20in%20Microelectronics%20and%20Micro-Systems&rft.au=Biesheuvel,%20P.M.&rft.date=2008-04&rft.spage=1&rft.epage=5&rft.pages=1-5&rft.isbn=1424421276&rft.isbn_list=9781424421275&rft_id=info:doi/10.1109/ESIME.2008.4525006&rft_dat=%3Cieee_6IE%3E4525006%3C/ieee_6IE%3E%3Curl%3E%3C/url%3E&rft.eisbn=9781424421282&rft.eisbn_list=1424421284&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=4525006&rfr_iscdi=true