Special Section on the International Conference on Microelectronic Test Structures

The ten papers in this special section were selected from papers presented at the 2006 International Conference on Microelectronic Test Structures, held in Austin, TX.

Bibliographische Detailangaben

Veröffentlicht in:	IEEE transactions on semiconductor manufacturing 2008-05, Vol.21 (2), p.131-131
1. Verfasser:	Yeric, Greg
Format:	Artikel
Sprache:	eng
Schlagworte:	Centralized control Circuit testing Design for manufacture Electronics industry Microelectronics Semiconductor device manufacture Semiconductor device testing Silicon Special issues and sections
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