Structural DfT Approach on Folded ADCs
This paper presents a structural design for test approach for folding and interpolated analog-to-digital converters. In this methodology relative deviations between internal ADC nodes are measured to detect the presence of a fault. A behavioral model of the ADC and the DfT has been done in MATLAB/SI...
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creator | Mozuelos, R. Lechuga, Y. Martinez, M. Bracho, S. |
description | This paper presents a structural design for test approach for folding and interpolated analog-to-digital converters. In this methodology relative deviations between internal ADC nodes are measured to detect the presence of a fault. A behavioral model of the ADC and the DfT has been done in MATLAB/SIMULINK environment to evaluate the efficiency of the proposed test approach compared to a functional test. |
doi_str_mv | 10.1109/ICECS.2007.4510971 |
format | Conference Proceeding |
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In this methodology relative deviations between internal ADC nodes are measured to detect the presence of a fault. A behavioral model of the ADC and the DfT has been done in MATLAB/SIMULINK environment to evaluate the efficiency of the proposed test approach compared to a functional test.</description><identifier>ISBN: 142441377X</identifier><identifier>ISBN: 9781424413775</identifier><identifier>EISBN: 1424413788</identifier><identifier>EISBN: 9781424413782</identifier><identifier>DOI: 10.1109/ICECS.2007.4510971</identifier><identifier>LCCN: 2007928620</identifier><language>eng</language><publisher>IEEE</publisher><subject>Analog-digital conversion ; Circuit faults ; Circuit testing ; Design for testability ; Energy consumption ; Mathematical model ; MATLAB ; Microelectronics ; Performance evaluation ; Systems engineering and theory</subject><ispartof>2007 14th IEEE International Conference on Electronics, Circuits and Systems, 2007, p.226-229</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/4510971$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2058,27925,54920</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/4510971$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Mozuelos, R.</creatorcontrib><creatorcontrib>Lechuga, Y.</creatorcontrib><creatorcontrib>Martinez, M.</creatorcontrib><creatorcontrib>Bracho, S.</creatorcontrib><title>Structural DfT Approach on Folded ADCs</title><title>2007 14th IEEE International Conference on Electronics, Circuits and Systems</title><addtitle>ICECS</addtitle><description>This paper presents a structural design for test approach for folding and interpolated analog-to-digital converters. In this methodology relative deviations between internal ADC nodes are measured to detect the presence of a fault. A behavioral model of the ADC and the DfT has been done in MATLAB/SIMULINK environment to evaluate the efficiency of the proposed test approach compared to a functional test.</description><subject>Analog-digital conversion</subject><subject>Circuit faults</subject><subject>Circuit testing</subject><subject>Design for testability</subject><subject>Energy consumption</subject><subject>Mathematical model</subject><subject>MATLAB</subject><subject>Microelectronics</subject><subject>Performance evaluation</subject><subject>Systems engineering and theory</subject><isbn>142441377X</isbn><isbn>9781424413775</isbn><isbn>1424413788</isbn><isbn>9781424413782</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2007</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNpFT0tLw0AYXJGCtvYP6CUnb4m73377OoZtq4WCh1bwVvYVjEQTkvTgvzfSgnMZZhiGGULuGS0Yo-Zpa9d2XwClqkAxGYpdkTlDQGRcaX39L9T7jMz_gga0BHpDlsPwSSegQBD6ljzux_4UxlPvmmxVHbKy6_rWhY-s_c42bRNTzMqVHe7IrHLNkJYXXpC3zfpgX_Ld6_PWlru8ZkqMuU9GppSQexTRSdDCSyV94Ao8RweS-xCicXGa6SoMnifQJgmhYRoJyBfk4dxbTzXHrq-_XP9zvJzkv6h3QY8</recordid><startdate>200712</startdate><enddate>200712</enddate><creator>Mozuelos, R.</creator><creator>Lechuga, Y.</creator><creator>Martinez, M.</creator><creator>Bracho, S.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>200712</creationdate><title>Structural DfT Approach on Folded ADCs</title><author>Mozuelos, R. ; Lechuga, Y. ; Martinez, M. ; Bracho, S.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i175t-be96eee43b45da6285b676bc372b34a263bccd9ad378af4cb3e289e5582200243</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2007</creationdate><topic>Analog-digital conversion</topic><topic>Circuit faults</topic><topic>Circuit testing</topic><topic>Design for testability</topic><topic>Energy consumption</topic><topic>Mathematical model</topic><topic>MATLAB</topic><topic>Microelectronics</topic><topic>Performance evaluation</topic><topic>Systems engineering and theory</topic><toplevel>online_resources</toplevel><creatorcontrib>Mozuelos, R.</creatorcontrib><creatorcontrib>Lechuga, Y.</creatorcontrib><creatorcontrib>Martinez, M.</creatorcontrib><creatorcontrib>Bracho, S.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Mozuelos, R.</au><au>Lechuga, Y.</au><au>Martinez, M.</au><au>Bracho, S.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Structural DfT Approach on Folded ADCs</atitle><btitle>2007 14th IEEE International Conference on Electronics, Circuits and Systems</btitle><stitle>ICECS</stitle><date>2007-12</date><risdate>2007</risdate><spage>226</spage><epage>229</epage><pages>226-229</pages><isbn>142441377X</isbn><isbn>9781424413775</isbn><eisbn>1424413788</eisbn><eisbn>9781424413782</eisbn><abstract>This paper presents a structural design for test approach for folding and interpolated analog-to-digital converters. In this methodology relative deviations between internal ADC nodes are measured to detect the presence of a fault. A behavioral model of the ADC and the DfT has been done in MATLAB/SIMULINK environment to evaluate the efficiency of the proposed test approach compared to a functional test.</abstract><pub>IEEE</pub><doi>10.1109/ICECS.2007.4510971</doi><tpages>4</tpages></addata></record> |
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source | IEEE Electronic Library (IEL) Conference Proceedings |
subjects | Analog-digital conversion Circuit faults Circuit testing Design for testability Energy consumption Mathematical model MATLAB Microelectronics Performance evaluation Systems engineering and theory |
title | Structural DfT Approach on Folded ADCs |
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