An SSO Based Methodology for EM Emission Estimation from SoCs
A methodology to estimate electromagnetic (EM) emission from SoCs is presented. The solution works on estimating current spectral components at the SoC periphery by performing power integrity analysis based on simultaneously switching outputs (SSO). These components are then converted to electric an...
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| creator | Jairam, S. Stalin, S.M. Oberle, J.-Y. Udayakumar, H. |
| description | A methodology to estimate electromagnetic (EM) emission from SoCs is presented. The solution works on estimating current spectral components at the SoC periphery by performing power integrity analysis based on simultaneously switching outputs (SSO). These components are then converted to electric and magnetic dipoles. The dipoles are then analysed by a customised field solver, which computes, the field radiation patterns. Antenna models have been generated through the lead frames for quad flat and ball grid array packages. The proposed approach enables unification of SoC periphery analysis platform for timing, signal, power integrity alongwith EM emission estimation. Finally the approach has been demonstrated on various SoC periphery analysis scenarios. A memory interface of a 90 nm SOC design has been analysed and results have been compared with silicon measurements. |
| doi_str_mv | 10.1109/ISQED.2008.4479743 |
| format | Conference Proceeding |
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The solution works on estimating current spectral components at the SoC periphery by performing power integrity analysis based on simultaneously switching outputs (SSO). These components are then converted to electric and magnetic dipoles. The dipoles are then analysed by a customised field solver, which computes, the field radiation patterns. Antenna models have been generated through the lead frames for quad flat and ball grid array packages. The proposed approach enables unification of SoC periphery analysis platform for timing, signal, power integrity alongwith EM emission estimation. Finally the approach has been demonstrated on various SoC periphery analysis scenarios. 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A memory interface of a 90 nm SOC design has been analysed and results have been compared with silicon measurements.</description><subject>Antenna radiation patterns</subject><subject>Dipole antennas</subject><subject>Electronics packaging</subject><subject>Magnetic analysis</subject><subject>Mesh generation</subject><subject>Pattern analysis</subject><subject>Performance analysis</subject><subject>Signal analysis</subject><subject>Silicon</subject><subject>Timing</subject><issn>1948-3287</issn><issn>1948-3295</issn><isbn>9780769531175</isbn><isbn>0769531172</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2008</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNo9UMtOwzAQtIBKlJIfgIt_IMHxa70HDiUEqNSqQoFzFSc2BDU1inPp3xNExV5mpHlotITc5CzLc4Z3q-q1fMw4YyaTEhCkOCPzHKVJBUd1ThIEw0CjEnkO6uJfMzAjV1MMUAomxCVJYvxi0wlUKHFO7pcHWlVb-lBH19KNGz9DG_bh40h9GGi5oWXfxdiFAy3j2PX1-Ev9EHpahSJek5mv99ElJ1yQ96fyrXhJ19vnVbFcp920Zkwtt1aiAsOlBu4bCdqLmmnHmGtF4zz3LYBtGqe8mDwKUEujG811bVtrxYLc_vV2zrnd9zANGY670yfED4cUTHk</recordid><startdate>200803</startdate><enddate>200803</enddate><creator>Jairam, S.</creator><creator>Stalin, S.M.</creator><creator>Oberle, J.-Y.</creator><creator>Udayakumar, H.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>200803</creationdate><title>An SSO Based Methodology for EM Emission Estimation from SoCs</title><author>Jairam, S. ; Stalin, S.M. ; Oberle, J.-Y. ; Udayakumar, H.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i175t-b2bb4957824672fc476f3a06e00ed3cef2fd77bcce5f32465796486c626abdbb3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2008</creationdate><topic>Antenna radiation patterns</topic><topic>Dipole antennas</topic><topic>Electronics packaging</topic><topic>Magnetic analysis</topic><topic>Mesh generation</topic><topic>Pattern analysis</topic><topic>Performance analysis</topic><topic>Signal analysis</topic><topic>Silicon</topic><topic>Timing</topic><toplevel>online_resources</toplevel><creatorcontrib>Jairam, S.</creatorcontrib><creatorcontrib>Stalin, S.M.</creatorcontrib><creatorcontrib>Oberle, J.-Y.</creatorcontrib><creatorcontrib>Udayakumar, H.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Jairam, S.</au><au>Stalin, S.M.</au><au>Oberle, J.-Y.</au><au>Udayakumar, H.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>An SSO Based Methodology for EM Emission Estimation from SoCs</atitle><btitle>9th International Symposium on Quality Electronic Design (isqed 2008)</btitle><stitle>ISQED</stitle><date>2008-03</date><risdate>2008</risdate><spage>297</spage><epage>300</epage><pages>297-300</pages><issn>1948-3287</issn><eissn>1948-3295</eissn><isbn>9780769531175</isbn><isbn>0769531172</isbn><abstract>A methodology to estimate electromagnetic (EM) emission from SoCs is presented. The solution works on estimating current spectral components at the SoC periphery by performing power integrity analysis based on simultaneously switching outputs (SSO). These components are then converted to electric and magnetic dipoles. The dipoles are then analysed by a customised field solver, which computes, the field radiation patterns. Antenna models have been generated through the lead frames for quad flat and ball grid array packages. The proposed approach enables unification of SoC periphery analysis platform for timing, signal, power integrity alongwith EM emission estimation. Finally the approach has been demonstrated on various SoC periphery analysis scenarios. A memory interface of a 90 nm SOC design has been analysed and results have been compared with silicon measurements.</abstract><pub>IEEE</pub><doi>10.1109/ISQED.2008.4479743</doi><tpages>4</tpages></addata></record> |
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| identifier | ISSN: 1948-3287 |
| ispartof | 9th International Symposium on Quality Electronic Design (isqed 2008), 2008, p.297-300 |
| issn | 1948-3287 1948-3295 |
| language | eng |
| recordid | cdi_ieee_primary_4479743 |
| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Antenna radiation patterns Dipole antennas Electronics packaging Magnetic analysis Mesh generation Pattern analysis Performance analysis Signal analysis Silicon Timing |
| title | An SSO Based Methodology for EM Emission Estimation from SoCs |
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