High Energy Pulse Generator in Reliability Researches of Thick-Film Structures

In modern electronic microcircuits the intended and unintentional dynamic changes of the temperature (for example caused be electrical signals) are very often observed. The good knowledge about these phenomena is the basis of lifetime and reliability determination in the real-world operating conditi...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Blad, G., Kalita, W., Klepacki, D., Rozak, F., Weglarski, M.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Ceramics Control systems Laboratories Microelectronics Microprocessors Pulse circuits Pulse generation Signal generators Temperature Voltage
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!