Giant nonlinear optical properties of Bi3.25La0.75Ti3O12 ferroelectric thin films on quartz substrate
The nonlinear properties of Bi 3.25 La 0.75 Ti 3 O 12 thin film grown on quartz substrate is measured using the Z-scan technique with ps-laser pulses at 532-nm wavelength. The nonlinear refractive index and absorption coefficients are 0.31times10 cm 2 /W and 3times10 -5 cm/W, respectively, indicatin...
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creator | Heedeuk Shin Hye Jeong Chang Boyd, R.W. Choi, M.R. Jo, W. |
description | The nonlinear properties of Bi 3.25 La 0.75 Ti 3 O 12 thin film grown on quartz substrate is measured using the Z-scan technique with ps-laser pulses at 532-nm wavelength. The nonlinear refractive index and absorption coefficients are 0.31times10 cm 2 /W and 3times10 -5 cm/W, respectively, indicating Bi 3.25 La 0.75 Ti 3 O 12 film on quartz is a good candidate for applications in nonlinear optical devices. |
doi_str_mv | 10.1109/CLEOPR.2007.4391334 |
format | Conference Proceeding |
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The nonlinear refractive index and absorption coefficients are 0.31times10 cm 2 /W and 3times10 -5 cm/W, respectively, indicating Bi 3.25 La 0.75 Ti 3 O 12 film on quartz is a good candidate for applications in nonlinear optical devices.</description><subject>Bismuth</subject><subject>Ferroelectric materials</subject><subject>Nonlinear optics</subject><subject>Optical films</subject><subject>Optical refraction</subject><subject>Optical variables control</subject><subject>Pulse measurements</subject><subject>Substrates</subject><subject>Transistors</subject><subject>Wavelength measurement</subject><isbn>1424411734</isbn><isbn>9781424411733</isbn><isbn>9781424411740</isbn><isbn>1424411742</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2007</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNo1UMFKAzEUjEhBW_sFveQHur7kJZvNUUutwkJFey9pfMHIdnfNpgf9elescxlmGIZhGFsIKIQAe7uq19vnl0ICmEKhFYjqgs2tqYSSSglhFFyy6b9ANWHT36yViFZfsfkwfMAIpZWE6prRJro287Zrm9iSS7zrc_Su4X3qeko50sC7wO8jFlLXDgqjdxG3QvJAKXXUkM8pep7fY8tDbI5jvOWfJ5fyNx9OhyEnl-mGTYJrBpqfecZeH9a71eOy3m6eVnf1MlrISwNVKA8kNZq3MohxMo0OailBWVBAFWldYhm81sqUvjwoQeiEsOSdtzhji7_WSET7PsWjS1_780n4A8Z2V_8</recordid><startdate>200708</startdate><enddate>200708</enddate><creator>Heedeuk Shin</creator><creator>Hye Jeong Chang</creator><creator>Boyd, R.W.</creator><creator>Choi, M.R.</creator><creator>Jo, W.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>200708</creationdate><title>Giant nonlinear optical properties of Bi3.25La0.75Ti3O12 ferroelectric thin films on quartz substrate</title><author>Heedeuk Shin ; Hye Jeong Chang ; Boyd, R.W. ; Choi, M.R. ; Jo, W.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i90t-708f6be2537d6f1923e08f3522049040e8e55636fc55476c6b41e3a119ecac93</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2007</creationdate><topic>Bismuth</topic><topic>Ferroelectric materials</topic><topic>Nonlinear optics</topic><topic>Optical films</topic><topic>Optical refraction</topic><topic>Optical variables control</topic><topic>Pulse measurements</topic><topic>Substrates</topic><topic>Transistors</topic><topic>Wavelength measurement</topic><toplevel>online_resources</toplevel><creatorcontrib>Heedeuk Shin</creatorcontrib><creatorcontrib>Hye Jeong Chang</creatorcontrib><creatorcontrib>Boyd, R.W.</creatorcontrib><creatorcontrib>Choi, M.R.</creatorcontrib><creatorcontrib>Jo, W.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Heedeuk Shin</au><au>Hye Jeong Chang</au><au>Boyd, R.W.</au><au>Choi, M.R.</au><au>Jo, W.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Giant nonlinear optical properties of Bi3.25La0.75Ti3O12 ferroelectric thin films on quartz substrate</atitle><btitle>2007 Conference on Lasers and Electro-Optics - Pacific Rim</btitle><stitle>CLEOPR</stitle><date>2007-08</date><risdate>2007</risdate><spage>1</spage><epage>2</epage><pages>1-2</pages><isbn>1424411734</isbn><isbn>9781424411733</isbn><eisbn>9781424411740</eisbn><eisbn>1424411742</eisbn><abstract>The nonlinear properties of Bi 3.25 La 0.75 Ti 3 O 12 thin film grown on quartz substrate is measured using the Z-scan technique with ps-laser pulses at 532-nm wavelength. The nonlinear refractive index and absorption coefficients are 0.31times10 cm 2 /W and 3times10 -5 cm/W, respectively, indicating Bi 3.25 La 0.75 Ti 3 O 12 film on quartz is a good candidate for applications in nonlinear optical devices.</abstract><pub>IEEE</pub><doi>10.1109/CLEOPR.2007.4391334</doi><tpages>2</tpages></addata></record> |
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subjects | Bismuth Ferroelectric materials Nonlinear optics Optical films Optical refraction Optical variables control Pulse measurements Substrates Transistors Wavelength measurement |
title | Giant nonlinear optical properties of Bi3.25La0.75Ti3O12 ferroelectric thin films on quartz substrate |
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