Giant nonlinear optical properties of Bi3.25La0.75Ti3O12 ferroelectric thin films on quartz substrate

The nonlinear properties of Bi 3.25 La 0.75 Ti 3 O 12 thin film grown on quartz substrate is measured using the Z-scan technique with ps-laser pulses at 532-nm wavelength. The nonlinear refractive index and absorption coefficients are 0.31times10 cm 2 /W and 3times10 -5 cm/W, respectively, indicatin...

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Hauptverfasser: Heedeuk Shin, Hye Jeong Chang, Boyd, R.W., Choi, M.R., Jo, W.
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Jo, W.
description The nonlinear properties of Bi 3.25 La 0.75 Ti 3 O 12 thin film grown on quartz substrate is measured using the Z-scan technique with ps-laser pulses at 532-nm wavelength. The nonlinear refractive index and absorption coefficients are 0.31times10 cm 2 /W and 3times10 -5 cm/W, respectively, indicating Bi 3.25 La 0.75 Ti 3 O 12 film on quartz is a good candidate for applications in nonlinear optical devices.
doi_str_mv 10.1109/CLEOPR.2007.4391334
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subjects Bismuth
Ferroelectric materials
Nonlinear optics
Optical films
Optical refraction
Optical variables control
Pulse measurements
Substrates
Transistors
Wavelength measurement
title Giant nonlinear optical properties of Bi3.25La0.75Ti3O12 ferroelectric thin films on quartz substrate
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