The Region-Exhaustive Fault Model

Device failure mechanisms of today's deep sub-micron processes are not well-modeled by single stuck-at faults, and hence several advanced fault models have been proposed in the past. Gate-exhaustive fault models were proposed to exercise a gate completely and then observe the resultant response...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Jas, A., Natarajan, S., Patil, S.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Automatic test pattern generation Bridge circuits Circuit faults Circuit testing Failure analysis Fault detection Geometry Geophysical measurement techniques Ground penetrating radar Logic testing
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