Schwarz-Christoffel approach for conductance fluctuations
Based on an exact two-dimensional current distribution we calculate the geometrical factor for conductance fluctuations. A thin square sample is assumed with four or two active electrodes. Circular electrodes of different size are considered at the sample corners.
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| creator | van Deursen, A.P.J. Vandamme, L.K.J. |
| description | Based on an exact two-dimensional current distribution we calculate the geometrical factor for conductance fluctuations. A thin square sample is assumed with four or two active electrodes. Circular electrodes of different size are considered at the sample corners. |
| doi_str_mv | 10.1109/ICEAA.2007.4387432 |
| format | Conference Proceeding |
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A thin square sample is assumed with four or two active electrodes. Circular electrodes of different size are considered at the sample corners.</description><subject>Current density</subject><subject>Current distribution</subject><subject>Current measurement</subject><subject>Electrodes</subject><subject>Fluctuations</subject><subject>H infinity control</subject><subject>Jacobian matrices</subject><subject>Noise shaping</subject><subject>Strips</subject><subject>Voltage</subject><isbn>9781424407668</isbn><isbn>1424407664</isbn><isbn>9781424407675</isbn><isbn>1424407672</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2007</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNpVj01Lw0AYhFekoNb8Ab3kDyS--73vMYSqhYIHey-b_SCRmIRNiuivN2AvnmbmYRgYQh4olJQCPu3rXVWVDECXghstOLsiGWpDBRMCtNLy-l9WZkPu1rpCLhHkDcnm-QMAqFYckd4SfHftl00_Rd2mbl7GGEOf22lKo3VtHseUu3HwZ7fYwYU89qs726Ubh_mebKLt55BddEuOz7tj_Voc3l72dXUoOoSlaAIXSkfZiOhpNNpyE6QKboXUKW-QNRG1A6mkE8wb75zlDTKtOfUCGN-Sx7_ZLoRwmlL3adP36XKe_wLhwUtg</recordid><startdate>200709</startdate><enddate>200709</enddate><creator>van Deursen, A.P.J.</creator><creator>Vandamme, L.K.J.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>200709</creationdate><title>Schwarz-Christoffel approach for conductance fluctuations</title><author>van Deursen, A.P.J. ; Vandamme, L.K.J.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i90t-be3467f5b4fd1f87a38e56ec4671c6d892bf97c0565c42d8dcca3b927731d4023</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2007</creationdate><topic>Current density</topic><topic>Current distribution</topic><topic>Current measurement</topic><topic>Electrodes</topic><topic>Fluctuations</topic><topic>H infinity control</topic><topic>Jacobian matrices</topic><topic>Noise shaping</topic><topic>Strips</topic><topic>Voltage</topic><toplevel>online_resources</toplevel><creatorcontrib>van Deursen, A.P.J.</creatorcontrib><creatorcontrib>Vandamme, L.K.J.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>van Deursen, A.P.J.</au><au>Vandamme, L.K.J.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Schwarz-Christoffel approach for conductance fluctuations</atitle><btitle>2007 International Conference on Electromagnetics in Advanced Applications</btitle><stitle>ICEAA</stitle><date>2007-09</date><risdate>2007</risdate><spage>830</spage><epage>833</epage><pages>830-833</pages><isbn>9781424407668</isbn><isbn>1424407664</isbn><eisbn>9781424407675</eisbn><eisbn>1424407672</eisbn><abstract>Based on an exact two-dimensional current distribution we calculate the geometrical factor for conductance fluctuations. A thin square sample is assumed with four or two active electrodes. Circular electrodes of different size are considered at the sample corners.</abstract><pub>IEEE</pub><doi>10.1109/ICEAA.2007.4387432</doi><tpages>4</tpages></addata></record> |
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| ispartof | 2007 International Conference on Electromagnetics in Advanced Applications, 2007, p.830-833 |
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| language | eng |
| recordid | cdi_ieee_primary_4387432 |
| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Current density Current distribution Current measurement Electrodes Fluctuations H infinity control Jacobian matrices Noise shaping Strips Voltage |
| title | Schwarz-Christoffel approach for conductance fluctuations |
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