PIXE as an Analytical Tool: An External-Beam System in Helium and the Role of Sample Preparation

PIXE as an Analytical Tool: An External-Beam System in Helium and the Role of Sample Preparation

A PIXE system in which samples in a helium-filled target chamber are irradiated by an external proton beam is described. The system is well suited for study of a wide range of materials, some merely calling for qualitative analysis, and others requiring quantitative measurements. This variety mandat...

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Veröffentlicht in:IEEE transactions on nuclear science 1981-01, Vol.28 (2), p.1382-1385
Hauptverfasser: Williams, Evan T., Finston, Harmon L.
Format: Artikel
Sprache:eng
Schlagworte:
Atmosphere
Chemistry
Educational institutions
Helium
Ion beams
Particle beams
Protons
Structural beams
X-ray detection
X-ray detectors
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Zusammenfassung:A PIXE system in which samples in a helium-filled target chamber are irradiated by an external proton beam is described. The system is well suited for study of a wide range of materials, some merely calling for qualitative analysis, and others requiring quantitative measurements. This variety mandates a flexible approach to sample preparation in order to obtain full sensitivity of the system. Some examples taken from our work are given.
ISSN:0018-9499
1558-1578
DOI:10.1109/TNS.1981.4331421