Design Approach to Radiation-Hardened I2L Gate Arrays

Conventional I2L structures are considered for the design of radiation-hardened I2L gate arrays, and design guidelines have been developed for this purpose. It is concluded that the parallel injector design offers the bestperformance in terms of speed, processing simplicity and radiation hardness. P...

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Veröffentlicht in:	IEEE transactions on nuclear science 1978-01, Vol.25 (6), p.1494-1501
Hauptverfasser:	Bahraman, Ali, Chang, Stephen, Romeo, Donald, Schuegraf, Klaus
Format:	Artikel
Sprache:	eng
Schlagworte:	Aerospace electronics Circuits Current measurement Degradation Delay effects Epitaxial layers Neutrons Performance gain Time measurement Voltage
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