Radiation Hardened LSI for the 1980's: CMOS/SOS vs. I2L

Gespeichert in:

Bibliographische Detailangaben
Veröffentlicht in:	IEEE transactions on nuclear science 1977-01, Vol.24 (6), p.2336-2340
Hauptverfasser:	Donovan, R. P., Simons, M., Burger, R. M.
Format:	Artikel
Sprache:	eng
Schlagworte:	Aerospace electronics Availability CMOS technology Costs Hardware Integrated circuit technology Laboratories Large scale integration Neutrons Radiation hardening
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

container_end_page	2340
container_issue	6
container_start_page	2336
container_title	IEEE transactions on nuclear science
container_volume	24
creator	Donovan, R. P. Simons, M. Burger, R. M.
description
doi_str_mv	10.1109/TNS.1977.4329217
format	Article
fullrecord	<record><control><sourceid>crossref_RIE</sourceid><recordid>TN_cdi_ieee_primary_4329217</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>4329217</ieee_id><sourcerecordid>10_1109_TNS_1977_4329217</sourcerecordid><originalsourceid>FETCH-LOGICAL-c193t-970ad45a94d855f574d534b95a6030804f74ba2ff96d98e2f32ff694fcd07a9d3</originalsourceid><addsrcrecordid>eNo9j0FLxDAQRoMoWFfvgpfcPLU7aZIm402K6xaqBbueS7ZJsKJbSYrgv7fLrp5mhu97A4-QawYZY4DLzXObMVQqEzzHnKkTkjApdcqk0qckAWA6RYF4Ti5ifJ9PIUEmRL0YO5hpGHd0bYJ1O2dp3VbUj4FOb44y1HAb72j51LTLtmnpd8xoldeX5Mybj-iujnNBXlcPm3Kd1s1jVd7Xac-QTykqMFZIg8JqKb1UwkoutihNARw0CK_E1uTeY2FRu9zzeS9Q-N6CMmj5gsDhbx_GGIPz3VcYPk346Rh0e_FuFu_24t1RfEZuDsjgnPuv_6W_N3NQYg</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Radiation Hardened LSI for the 1980's: CMOS/SOS vs. I2L</title><source>IEEE Electronic Library (IEL)</source><creator>Donovan, R. P. ; Simons, M. ; Burger, R. M.</creator><creatorcontrib>Donovan, R. P. ; Simons, M. ; Burger, R. M.</creatorcontrib><identifier>ISSN: 0018-9499</identifier><identifier>EISSN: 1558-1578</identifier><identifier>DOI: 10.1109/TNS.1977.4329217</identifier><identifier>CODEN: IETNAE</identifier><language>eng</language><publisher>IEEE</publisher><subject>Aerospace electronics ; Availability ; CMOS technology ; Costs ; Hardware ; Integrated circuit technology ; Laboratories ; Large scale integration ; Neutrons ; Radiation hardening</subject><ispartof>IEEE transactions on nuclear science, 1977-01, Vol.24 (6), p.2336-2340</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c193t-970ad45a94d855f574d534b95a6030804f74ba2ff96d98e2f32ff694fcd07a9d3</citedby><cites>FETCH-LOGICAL-c193t-970ad45a94d855f574d534b95a6030804f74ba2ff96d98e2f32ff694fcd07a9d3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/4329217$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,777,781,793,27905,27906,54739</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/4329217$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Donovan, R. P.</creatorcontrib><creatorcontrib>Simons, M.</creatorcontrib><creatorcontrib>Burger, R. M.</creatorcontrib><title>Radiation Hardened LSI for the 1980's: CMOS/SOS vs. I2L</title><title>IEEE transactions on nuclear science</title><addtitle>TNS</addtitle><subject>Aerospace electronics</subject><subject>Availability</subject><subject>CMOS technology</subject><subject>Costs</subject><subject>Hardware</subject><subject>Integrated circuit technology</subject><subject>Laboratories</subject><subject>Large scale integration</subject><subject>Neutrons</subject><subject>Radiation hardening</subject><issn>0018-9499</issn><issn>1558-1578</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1977</creationdate><recordtype>article</recordtype><recordid>eNo9j0FLxDAQRoMoWFfvgpfcPLU7aZIm402K6xaqBbueS7ZJsKJbSYrgv7fLrp5mhu97A4-QawYZY4DLzXObMVQqEzzHnKkTkjApdcqk0qckAWA6RYF4Ti5ifJ9PIUEmRL0YO5hpGHd0bYJ1O2dp3VbUj4FOb44y1HAb72j51LTLtmnpd8xoldeX5Mybj-iujnNBXlcPm3Kd1s1jVd7Xac-QTykqMFZIg8JqKb1UwkoutihNARw0CK_E1uTeY2FRu9zzeS9Q-N6CMmj5gsDhbx_GGIPz3VcYPk346Rh0e_FuFu_24t1RfEZuDsjgnPuv_6W_N3NQYg</recordid><startdate>19770101</startdate><enddate>19770101</enddate><creator>Donovan, R. P.</creator><creator>Simons, M.</creator><creator>Burger, R. M.</creator><general>IEEE</general><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>19770101</creationdate><title>Radiation Hardened LSI for the 1980's: CMOS/SOS vs. I2L</title><author>Donovan, R. P. ; Simons, M. ; Burger, R. M.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c193t-970ad45a94d855f574d534b95a6030804f74ba2ff96d98e2f32ff694fcd07a9d3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1977</creationdate><topic>Aerospace electronics</topic><topic>Availability</topic><topic>CMOS technology</topic><topic>Costs</topic><topic>Hardware</topic><topic>Integrated circuit technology</topic><topic>Laboratories</topic><topic>Large scale integration</topic><topic>Neutrons</topic><topic>Radiation hardening</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Donovan, R. P.</creatorcontrib><creatorcontrib>Simons, M.</creatorcontrib><creatorcontrib>Burger, R. M.</creatorcontrib><collection>CrossRef</collection><jtitle>IEEE transactions on nuclear science</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Donovan, R. P.</au><au>Simons, M.</au><au>Burger, R. M.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Radiation Hardened LSI for the 1980's: CMOS/SOS vs. I2L</atitle><jtitle>IEEE transactions on nuclear science</jtitle><stitle>TNS</stitle><date>1977-01-01</date><risdate>1977</risdate><volume>24</volume><issue>6</issue><spage>2336</spage><epage>2340</epage><pages>2336-2340</pages><issn>0018-9499</issn><eissn>1558-1578</eissn><coden>IETNAE</coden><pub>IEEE</pub><doi>10.1109/TNS.1977.4329217</doi><tpages>5</tpages></addata></record>
fulltext	fulltext_linktorsrc
identifier	ISSN: 0018-9499
ispartof	IEEE transactions on nuclear science, 1977-01, Vol.24 (6), p.2336-2340
issn	0018-9499 1558-1578
language	eng
recordid	cdi_ieee_primary_4329217
source	IEEE Electronic Library (IEL)
subjects	Aerospace electronics Availability CMOS technology Costs Hardware Integrated circuit technology Laboratories Large scale integration Neutrons Radiation hardening
title	Radiation Hardened LSI for the 1980's: CMOS/SOS vs. I2L
url	https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-21T05%3A15%3A40IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-crossref_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Radiation%20Hardened%20LSI%20for%20the%201980's:%20CMOS/SOS%20vs.%20I2L&rft.jtitle=IEEE%20transactions%20on%20nuclear%20science&rft.au=Donovan,%20R.%20P.&rft.date=1977-01-01&rft.volume=24&rft.issue=6&rft.spage=2336&rft.epage=2340&rft.pages=2336-2340&rft.issn=0018-9499&rft.eissn=1558-1578&rft.coden=IETNAE&rft_id=info:doi/10.1109/TNS.1977.4329217&rft_dat=%3Ccrossref_RIE%3E10_1109_TNS_1977_4329217%3C/crossref_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=4329217&rfr_iscdi=true