Materials Considerations in using Voltage Drop for Power Rating
Voltage drop, and change in voltage drop after aging, are considered in rating the performance of gold plated power contacts. In this case, samples are exposed to high current cycling at current levels that produce very high temperature rises. This created conditions that caused degradation due to t...
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creator | Malucci, R.D. Ruffino, F.R. |
description | Voltage drop, and change in voltage drop after aging, are considered in rating the performance of gold plated power contacts. In this case, samples are exposed to high current cycling at current levels that produce very high temperature rises. This created conditions that caused degradation due to thermal aging and possibly electro- migration. It is shown that the failure criterion for gold is similar, but not equal, to tin. Based on these results, it's concluded that loss of metallic contact regardless of plating type is the common factor in the tin and gold performance. Moreover, current density and contact voltage are discussed as basic physical parameters that provide links to aging and failure criteria. The aim is to develop a method using voltage drop for various contact materials to quantify power rating of contacts for reliable use in the field. |
doi_str_mv | 10.1109/HOLM.2007.4318190 |
format | Conference Proceeding |
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In this case, samples are exposed to high current cycling at current levels that produce very high temperature rises. This created conditions that caused degradation due to thermal aging and possibly electro- migration. It is shown that the failure criterion for gold is similar, but not equal, to tin. Based on these results, it's concluded that loss of metallic contact regardless of plating type is the common factor in the tin and gold performance. Moreover, current density and contact voltage are discussed as basic physical parameters that provide links to aging and failure criteria. The aim is to develop a method using voltage drop for various contact materials to quantify power rating of contacts for reliable use in the field.</description><identifier>ISSN: 1062-6808</identifier><identifier>ISBN: 9781424408375</identifier><identifier>ISBN: 1424408377</identifier><identifier>EISSN: 2158-9992</identifier><identifier>EISBN: 9781424408382</identifier><identifier>EISBN: 1424408385</identifier><identifier>DOI: 10.1109/HOLM.2007.4318190</identifier><language>eng</language><publisher>IEEE</publisher><subject>Aging ; Circuit testing ; Condition monitoring ; Electromigration ; Gold ; Performance loss ; Temperature ; Thermal degradation ; Tin ; Voltage</subject><ispartof>Electrical Contacts - 2007 Proceedings of the 53rd IEEE Holm Conference on Electrical Contacts, 2007, p.25-31</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/4318190$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2056,27924,54919</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/4318190$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Malucci, R.D.</creatorcontrib><creatorcontrib>Ruffino, F.R.</creatorcontrib><title>Materials Considerations in using Voltage Drop for Power Rating</title><title>Electrical Contacts - 2007 Proceedings of the 53rd IEEE Holm Conference on Electrical Contacts</title><addtitle>HOLM</addtitle><description>Voltage drop, and change in voltage drop after aging, are considered in rating the performance of gold plated power contacts. In this case, samples are exposed to high current cycling at current levels that produce very high temperature rises. This created conditions that caused degradation due to thermal aging and possibly electro- migration. It is shown that the failure criterion for gold is similar, but not equal, to tin. Based on these results, it's concluded that loss of metallic contact regardless of plating type is the common factor in the tin and gold performance. Moreover, current density and contact voltage are discussed as basic physical parameters that provide links to aging and failure criteria. The aim is to develop a method using voltage drop for various contact materials to quantify power rating of contacts for reliable use in the field.</description><subject>Aging</subject><subject>Circuit testing</subject><subject>Condition monitoring</subject><subject>Electromigration</subject><subject>Gold</subject><subject>Performance loss</subject><subject>Temperature</subject><subject>Thermal degradation</subject><subject>Tin</subject><subject>Voltage</subject><issn>1062-6808</issn><issn>2158-9992</issn><isbn>9781424408375</isbn><isbn>1424408377</isbn><isbn>9781424408382</isbn><isbn>1424408385</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2007</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNpVUMtKxEAQHF_gsuYDxMv8QGL3vDJzEomPFbKsiHpdJpNJGFmTZRIR_94B92Ifqhq6qiiakEuEAhHM9WpTrwsGUBaCo0YDRyQzpUbBhADNNTsmC4ZS58YYdvLvVspTskBQLFca9DnJpukD0giJnMGC3Kzt7GOwu4lW4zCF1kc7h7TRMNCvKQw9fR93s-09vYvjnnZjpM_jt4_0JemG_oKcdcnsswMvydvD_Wu1yuvN41N1W-cBSznnaF3LlOlM6VwCJQTjbYdGG9soqZvGK5DgdcO6JpXn2IEQ1lpnldPWSb4kV3-5wXu_3cfwaePP9vAO_gtv1k64</recordid><startdate>200709</startdate><enddate>200709</enddate><creator>Malucci, R.D.</creator><creator>Ruffino, F.R.</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope></search><sort><creationdate>200709</creationdate><title>Materials Considerations in using Voltage Drop for Power Rating</title><author>Malucci, R.D. ; Ruffino, F.R.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i175t-1acd269f97ccf9764423df1989ab658bbe6050e8b2fb78131f044aaaca6c8ac53</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2007</creationdate><topic>Aging</topic><topic>Circuit testing</topic><topic>Condition monitoring</topic><topic>Electromigration</topic><topic>Gold</topic><topic>Performance loss</topic><topic>Temperature</topic><topic>Thermal degradation</topic><topic>Tin</topic><topic>Voltage</topic><toplevel>online_resources</toplevel><creatorcontrib>Malucci, R.D.</creatorcontrib><creatorcontrib>Ruffino, F.R.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Malucci, R.D.</au><au>Ruffino, F.R.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Materials Considerations in using Voltage Drop for Power Rating</atitle><btitle>Electrical Contacts - 2007 Proceedings of the 53rd IEEE Holm Conference on Electrical Contacts</btitle><stitle>HOLM</stitle><date>2007-09</date><risdate>2007</risdate><spage>25</spage><epage>31</epage><pages>25-31</pages><issn>1062-6808</issn><eissn>2158-9992</eissn><isbn>9781424408375</isbn><isbn>1424408377</isbn><eisbn>9781424408382</eisbn><eisbn>1424408385</eisbn><abstract>Voltage drop, and change in voltage drop after aging, are considered in rating the performance of gold plated power contacts. In this case, samples are exposed to high current cycling at current levels that produce very high temperature rises. This created conditions that caused degradation due to thermal aging and possibly electro- migration. It is shown that the failure criterion for gold is similar, but not equal, to tin. Based on these results, it's concluded that loss of metallic contact regardless of plating type is the common factor in the tin and gold performance. Moreover, current density and contact voltage are discussed as basic physical parameters that provide links to aging and failure criteria. The aim is to develop a method using voltage drop for various contact materials to quantify power rating of contacts for reliable use in the field.</abstract><pub>IEEE</pub><doi>10.1109/HOLM.2007.4318190</doi><tpages>7</tpages></addata></record> |
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source | IEEE Electronic Library (IEL) Conference Proceedings |
subjects | Aging Circuit testing Condition monitoring Electromigration Gold Performance loss Temperature Thermal degradation Tin Voltage |
title | Materials Considerations in using Voltage Drop for Power Rating |
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