The Effect of Initial Connector Insertions on Electrical Contact Resistance
This work attempts to quantify the effect of repeated initial connector insertions and roughness on electrical contact resistance. Experimental measurements show that the electrical contact resistance increases measurably with repeated insertions. They also show that with repeated insertions the con...
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| creator | Jackson, R.L. Ashurst, W.R. Flowers, G.T. Angadi, S. Song-yul Choe Bozack, M.J. |
| description | This work attempts to quantify the effect of repeated initial connector insertions and roughness on electrical contact resistance. Experimental measurements show that the electrical contact resistance increases measurably with repeated insertions. They also show that with repeated insertions the connector spring is plastically deformed, thus causing the force closing the contact across the surfaces to decrease. A multi-scale rough surface contact model was used to estimate the actual electrical contact resistance (ECR) versus applied force curve of the connector. As expected, the multiscale ECR model predicts that the ECR will decrease with applied force. Since the contact force decreases with each insertion of the connector due to plastic deformation, the model will predict that the ECR will also increase with each insertion. When the added resistance from a measurable layer of tin oxide is included, the multiscale ECR model shows fairly good agreement with the experimental measurements. |
| doi_str_mv | 10.1109/HOLM.2007.4318189 |
| format | Conference Proceeding |
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Experimental measurements show that the electrical contact resistance increases measurably with repeated insertions. They also show that with repeated insertions the connector spring is plastically deformed, thus causing the force closing the contact across the surfaces to decrease. A multi-scale rough surface contact model was used to estimate the actual electrical contact resistance (ECR) versus applied force curve of the connector. As expected, the multiscale ECR model predicts that the ECR will decrease with applied force. Since the contact force decreases with each insertion of the connector due to plastic deformation, the model will predict that the ECR will also increase with each insertion. When the added resistance from a measurable layer of tin oxide is included, the multiscale ECR model shows fairly good agreement with the experimental measurements.</description><identifier>ISSN: 1062-6808</identifier><identifier>ISBN: 9781424408375</identifier><identifier>ISBN: 1424408377</identifier><identifier>EISSN: 2158-9992</identifier><identifier>EISBN: 9781424408382</identifier><identifier>EISBN: 1424408385</identifier><identifier>DOI: 10.1109/HOLM.2007.4318189</identifier><language>eng</language><publisher>IEEE</publisher><subject>connector ; Connectors ; Contact resistance ; Electric resistance ; Electric variables measurement ; Electrical resistance measurement ; Predictive models ; Rough surfaces ; Springs ; Surface resistance ; Surface roughness</subject><ispartof>Electrical Contacts - 2007 Proceedings of the 53rd IEEE Holm Conference on Electrical Contacts, 2007, p.17-24</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/4318189$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,776,780,785,786,2052,27902,54895</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/4318189$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Jackson, R.L.</creatorcontrib><creatorcontrib>Ashurst, W.R.</creatorcontrib><creatorcontrib>Flowers, G.T.</creatorcontrib><creatorcontrib>Angadi, S.</creatorcontrib><creatorcontrib>Song-yul Choe</creatorcontrib><creatorcontrib>Bozack, M.J.</creatorcontrib><title>The Effect of Initial Connector Insertions on Electrical Contact Resistance</title><title>Electrical Contacts - 2007 Proceedings of the 53rd IEEE Holm Conference on Electrical Contacts</title><addtitle>HOLM</addtitle><description>This work attempts to quantify the effect of repeated initial connector insertions and roughness on electrical contact resistance. 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When the added resistance from a measurable layer of tin oxide is included, the multiscale ECR model shows fairly good agreement with the experimental measurements.</description><subject>connector</subject><subject>Connectors</subject><subject>Contact resistance</subject><subject>Electric resistance</subject><subject>Electric variables measurement</subject><subject>Electrical resistance measurement</subject><subject>Predictive models</subject><subject>Rough surfaces</subject><subject>Springs</subject><subject>Surface resistance</subject><subject>Surface roughness</subject><issn>1062-6808</issn><issn>2158-9992</issn><isbn>9781424408375</isbn><isbn>1424408377</isbn><isbn>9781424408382</isbn><isbn>1424408385</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2007</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNpVkM1KxEAQhMc_MKx5APGSF0jsnp_MzFFCdBcjC7Kel0nSgyMxkUwuvr2B3Yt1Kfiqug_F2D1CgQj2cbtv3goOoAsp0KCxFyy12qDkUoIRhl-yhKMyubWWX_3LtLpmCULJ89KAuWVpjF-wSioUHBL2evikrPaeuiWbfLYbwxLckFXTOK5omlcSaV7CNMZsGrN6WOkculNlcevVO8UQFzd2dMduvBsipWffsI_n-lBt82b_squemjxwiUuOEsj3LdpeKiABWguwvC171QGCVq1B4q3hTmqnDXnyjsgrrXrrAEiJDXs4_Q1EdPyZw7ebf4_nacQfdUZSlA</recordid><startdate>200709</startdate><enddate>200709</enddate><creator>Jackson, R.L.</creator><creator>Ashurst, W.R.</creator><creator>Flowers, G.T.</creator><creator>Angadi, S.</creator><creator>Song-yul Choe</creator><creator>Bozack, M.J.</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope></search><sort><creationdate>200709</creationdate><title>The Effect of Initial Connector Insertions on Electrical Contact Resistance</title><author>Jackson, R.L. ; Ashurst, W.R. ; Flowers, G.T. ; Angadi, S. ; Song-yul Choe ; Bozack, M.J.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i241t-140efdb19d450e30773092b6d5c01075b81e2b82a47a78efefaeef575d9a00e53</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2007</creationdate><topic>connector</topic><topic>Connectors</topic><topic>Contact resistance</topic><topic>Electric resistance</topic><topic>Electric variables measurement</topic><topic>Electrical resistance measurement</topic><topic>Predictive models</topic><topic>Rough surfaces</topic><topic>Springs</topic><topic>Surface resistance</topic><topic>Surface roughness</topic><toplevel>online_resources</toplevel><creatorcontrib>Jackson, R.L.</creatorcontrib><creatorcontrib>Ashurst, W.R.</creatorcontrib><creatorcontrib>Flowers, G.T.</creatorcontrib><creatorcontrib>Angadi, S.</creatorcontrib><creatorcontrib>Song-yul Choe</creatorcontrib><creatorcontrib>Bozack, M.J.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Jackson, R.L.</au><au>Ashurst, W.R.</au><au>Flowers, G.T.</au><au>Angadi, S.</au><au>Song-yul Choe</au><au>Bozack, M.J.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>The Effect of Initial Connector Insertions on Electrical Contact Resistance</atitle><btitle>Electrical Contacts - 2007 Proceedings of the 53rd IEEE Holm Conference on Electrical Contacts</btitle><stitle>HOLM</stitle><date>2007-09</date><risdate>2007</risdate><spage>17</spage><epage>24</epage><pages>17-24</pages><issn>1062-6808</issn><eissn>2158-9992</eissn><isbn>9781424408375</isbn><isbn>1424408377</isbn><eisbn>9781424408382</eisbn><eisbn>1424408385</eisbn><abstract>This work attempts to quantify the effect of repeated initial connector insertions and roughness on electrical contact resistance. Experimental measurements show that the electrical contact resistance increases measurably with repeated insertions. They also show that with repeated insertions the connector spring is plastically deformed, thus causing the force closing the contact across the surfaces to decrease. A multi-scale rough surface contact model was used to estimate the actual electrical contact resistance (ECR) versus applied force curve of the connector. As expected, the multiscale ECR model predicts that the ECR will decrease with applied force. Since the contact force decreases with each insertion of the connector due to plastic deformation, the model will predict that the ECR will also increase with each insertion. When the added resistance from a measurable layer of tin oxide is included, the multiscale ECR model shows fairly good agreement with the experimental measurements.</abstract><pub>IEEE</pub><doi>10.1109/HOLM.2007.4318189</doi><tpages>8</tpages></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | ISSN: 1062-6808 |
| ispartof | Electrical Contacts - 2007 Proceedings of the 53rd IEEE Holm Conference on Electrical Contacts, 2007, p.17-24 |
| issn | 1062-6808 2158-9992 |
| language | eng |
| recordid | cdi_ieee_primary_4318189 |
| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | connector Connectors Contact resistance Electric resistance Electric variables measurement Electrical resistance measurement Predictive models Rough surfaces Springs Surface resistance Surface roughness |
| title | The Effect of Initial Connector Insertions on Electrical Contact Resistance |
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