ANA Calibration Method for Measurements of Dielectric Properties
Routine network analyzer calibration procedures in measurements of the dielectric properties of materials using an open-ended coaxial line probe are frequently inadequate and limit the accuracy of measurements. A calibration method, which makes use of liquids whose properties are well known, is prop...
Gespeichert in:
| Veröffentlicht in: | IEEE transactions on instrumentation and measurement 1983-06, Vol.32 (2), p.385-387 |
|---|---|
| Hauptverfasser: | , , |
| Format: | Artikel |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 387 |
|---|---|
| container_issue | 2 |
| container_start_page | 385 |
| container_title | IEEE transactions on instrumentation and measurement |
| container_volume | 32 |
| creator | Kraszewski, Andrzej Stuchly, Maria A. Stuchly, Stanislaw S. |
| description | Routine network analyzer calibration procedures in measurements of the dielectric properties of materials using an open-ended coaxial line probe are frequently inadequate and limit the accuracy of measurements. A calibration method, which makes use of liquids whose properties are well known, is proposed to alleviate this limitation. It is shown that even one liquid used as a standard in place of a matched load greatly improves the accuracy of measurements. Theoretical relationships and experimental results as well as some practical suggestions related to the application of this method are given. |
| doi_str_mv | 10.1109/TIM.1983.4315084 |
| format | Article |
| fullrecord | <record><control><sourceid>crossref_RIE</sourceid><recordid>TN_cdi_ieee_primary_4315084</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>4315084</ieee_id><sourcerecordid>10_1109_TIM_1983_4315084</sourcerecordid><originalsourceid>FETCH-LOGICAL-c374t-184ec8992c8c977d7bb523716ac9c7379a45e2f2f8dd1ac47d0223b9cb996aaf3</originalsourceid><addsrcrecordid>eNo9kLtOwzAYhS0EEqGwI7H4BVJ8iy8bUaBQqQWGMkeO81sYpU1lm4G3J1UL0znSuQwfQreUzCkl5n6zXM-p0XwuOK2IFmeooFWlSiMlO0cFIVSXRlTyEl2l9EUIUVKoAj3UrzVu7BC6aHMYd3gN-XPssR_jZG36jrCFXU549PgxwAAux-Dwexz3EHOAdI0uvB0S3Jx0hj4WT5vmpVy9PS-belU6rkQuqRbgtDHMaWeU6lXXVYwrKq0zTnFlrKiAeeZ131PrhOoJY7wzrjNGWuv5DJHjr4tjShF8u49ha-NPS0l7INBOBNoDgfZEYJrcHScBAP7rf-kvg7FXVw</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>ANA Calibration Method for Measurements of Dielectric Properties</title><source>IEEE Electronic Library (IEL)</source><creator>Kraszewski, Andrzej ; Stuchly, Maria A. ; Stuchly, Stanislaw S.</creator><creatorcontrib>Kraszewski, Andrzej ; Stuchly, Maria A. ; Stuchly, Stanislaw S.</creatorcontrib><description>Routine network analyzer calibration procedures in measurements of the dielectric properties of materials using an open-ended coaxial line probe are frequently inadequate and limit the accuracy of measurements. A calibration method, which makes use of liquids whose properties are well known, is proposed to alleviate this limitation. It is shown that even one liquid used as a standard in place of a matched load greatly improves the accuracy of measurements. Theoretical relationships and experimental results as well as some practical suggestions related to the application of this method are given.</description><identifier>ISSN: 0018-9456</identifier><identifier>EISSN: 1557-9662</identifier><identifier>DOI: 10.1109/TIM.1983.4315084</identifier><identifier>CODEN: IEIMAO</identifier><language>eng</language><publisher>IEEE</publisher><subject>Calibration ; Coaxial components ; Dielectric measurements ; Frequency ; Impedance measurement ; Liquids ; Measurement standards ; Permittivity measurement ; Probes ; Reflection</subject><ispartof>IEEE transactions on instrumentation and measurement, 1983-06, Vol.32 (2), p.385-387</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c374t-184ec8992c8c977d7bb523716ac9c7379a45e2f2f8dd1ac47d0223b9cb996aaf3</citedby><cites>FETCH-LOGICAL-c374t-184ec8992c8c977d7bb523716ac9c7379a45e2f2f8dd1ac47d0223b9cb996aaf3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/4315084$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,777,781,793,27905,27906,54739</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/4315084$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Kraszewski, Andrzej</creatorcontrib><creatorcontrib>Stuchly, Maria A.</creatorcontrib><creatorcontrib>Stuchly, Stanislaw S.</creatorcontrib><title>ANA Calibration Method for Measurements of Dielectric Properties</title><title>IEEE transactions on instrumentation and measurement</title><addtitle>TIM</addtitle><description>Routine network analyzer calibration procedures in measurements of the dielectric properties of materials using an open-ended coaxial line probe are frequently inadequate and limit the accuracy of measurements. A calibration method, which makes use of liquids whose properties are well known, is proposed to alleviate this limitation. It is shown that even one liquid used as a standard in place of a matched load greatly improves the accuracy of measurements. Theoretical relationships and experimental results as well as some practical suggestions related to the application of this method are given.</description><subject>Calibration</subject><subject>Coaxial components</subject><subject>Dielectric measurements</subject><subject>Frequency</subject><subject>Impedance measurement</subject><subject>Liquids</subject><subject>Measurement standards</subject><subject>Permittivity measurement</subject><subject>Probes</subject><subject>Reflection</subject><issn>0018-9456</issn><issn>1557-9662</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1983</creationdate><recordtype>article</recordtype><recordid>eNo9kLtOwzAYhS0EEqGwI7H4BVJ8iy8bUaBQqQWGMkeO81sYpU1lm4G3J1UL0znSuQwfQreUzCkl5n6zXM-p0XwuOK2IFmeooFWlSiMlO0cFIVSXRlTyEl2l9EUIUVKoAj3UrzVu7BC6aHMYd3gN-XPssR_jZG36jrCFXU549PgxwAAux-Dwexz3EHOAdI0uvB0S3Jx0hj4WT5vmpVy9PS-belU6rkQuqRbgtDHMaWeU6lXXVYwrKq0zTnFlrKiAeeZ131PrhOoJY7wzrjNGWuv5DJHjr4tjShF8u49ha-NPS0l7INBOBNoDgfZEYJrcHScBAP7rf-kvg7FXVw</recordid><startdate>198306</startdate><enddate>198306</enddate><creator>Kraszewski, Andrzej</creator><creator>Stuchly, Maria A.</creator><creator>Stuchly, Stanislaw S.</creator><general>IEEE</general><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>198306</creationdate><title>ANA Calibration Method for Measurements of Dielectric Properties</title><author>Kraszewski, Andrzej ; Stuchly, Maria A. ; Stuchly, Stanislaw S.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c374t-184ec8992c8c977d7bb523716ac9c7379a45e2f2f8dd1ac47d0223b9cb996aaf3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1983</creationdate><topic>Calibration</topic><topic>Coaxial components</topic><topic>Dielectric measurements</topic><topic>Frequency</topic><topic>Impedance measurement</topic><topic>Liquids</topic><topic>Measurement standards</topic><topic>Permittivity measurement</topic><topic>Probes</topic><topic>Reflection</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Kraszewski, Andrzej</creatorcontrib><creatorcontrib>Stuchly, Maria A.</creatorcontrib><creatorcontrib>Stuchly, Stanislaw S.</creatorcontrib><collection>CrossRef</collection><jtitle>IEEE transactions on instrumentation and measurement</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Kraszewski, Andrzej</au><au>Stuchly, Maria A.</au><au>Stuchly, Stanislaw S.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>ANA Calibration Method for Measurements of Dielectric Properties</atitle><jtitle>IEEE transactions on instrumentation and measurement</jtitle><stitle>TIM</stitle><date>1983-06</date><risdate>1983</risdate><volume>32</volume><issue>2</issue><spage>385</spage><epage>387</epage><pages>385-387</pages><issn>0018-9456</issn><eissn>1557-9662</eissn><coden>IEIMAO</coden><abstract>Routine network analyzer calibration procedures in measurements of the dielectric properties of materials using an open-ended coaxial line probe are frequently inadequate and limit the accuracy of measurements. A calibration method, which makes use of liquids whose properties are well known, is proposed to alleviate this limitation. It is shown that even one liquid used as a standard in place of a matched load greatly improves the accuracy of measurements. Theoretical relationships and experimental results as well as some practical suggestions related to the application of this method are given.</abstract><pub>IEEE</pub><doi>10.1109/TIM.1983.4315084</doi><tpages>3</tpages></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | ISSN: 0018-9456 |
| ispartof | IEEE transactions on instrumentation and measurement, 1983-06, Vol.32 (2), p.385-387 |
| issn | 0018-9456 1557-9662 |
| language | eng |
| recordid | cdi_ieee_primary_4315084 |
| source | IEEE Electronic Library (IEL) |
| subjects | Calibration Coaxial components Dielectric measurements Frequency Impedance measurement Liquids Measurement standards Permittivity measurement Probes Reflection |
| title | ANA Calibration Method for Measurements of Dielectric Properties |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-20T03%3A06%3A06IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-crossref_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=ANA%20Calibration%20Method%20for%20Measurements%20of%20Dielectric%20Properties&rft.jtitle=IEEE%20transactions%20on%20instrumentation%20and%20measurement&rft.au=Kraszewski,%20Andrzej&rft.date=1983-06&rft.volume=32&rft.issue=2&rft.spage=385&rft.epage=387&rft.pages=385-387&rft.issn=0018-9456&rft.eissn=1557-9662&rft.coden=IEIMAO&rft_id=info:doi/10.1109/TIM.1983.4315084&rft_dat=%3Ccrossref_RIE%3E10_1109_TIM_1983_4315084%3C/crossref_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=4315084&rfr_iscdi=true |