Mode Suppressed TEM Cell Design For High Frequency IC Measurements

Mode Suppressed TEM Cell Design For High Frequency IC Measurements

TEM cells or GTEM cells can be used to evaluate the radiated emissions of integrated circuits (ICs). The applicable frequency bandwidth of a TEM cell is limited due to the resonances of higher order modes. This paper describes how a TEM cell can be modified to extend the frequency range without chan...

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Hauptverfasser: Shaowei Deng, Pommerenke, D., Hubing, T., Drewniak, J., Beetner, D., Dongshik Shin, Sungnam Kim, Hocheol Kwak
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Bandwidth
Circuit testing
Cutoff frequency
Electromagnetic measurements
Frequency measurement
Magnetic fields
Resonance
Resonant frequency
Tellurium
TEM cells
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creator Shaowei Deng
Pommerenke, D.
Hubing, T.
Drewniak, J.
Beetner, D.
Dongshik Shin
Sungnam Kim
Hocheol Kwak
description TEM cells or GTEM cells can be used to evaluate the radiated emissions of integrated circuits (ICs). The applicable frequency bandwidth of a TEM cell is limited due to the resonances of higher order modes. This paper describes how a TEM cell can be modified to extend the frequency range without changing the test topology. Several methods are proposed and implemented to suppress the higher order modes. The magnetic field coupling and electric field coupling are evaluated for the new design. The frequency bandwidth of the modified TEM cell is extended from original 1 GHz to 2. 5 GHz.
doi_str_mv 10.1109/ISEMC.2007.13
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subjects Bandwidth
Circuit testing
Cutoff frequency
Electromagnetic measurements
Frequency measurement
Magnetic fields
Resonance
Resonant frequency
Tellurium
TEM cells
title Mode Suppressed TEM Cell Design For High Frequency IC Measurements
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