On Recent Generalizations of the Weibull Distribution

This short communication first offers a clarification to a claim by Nadarajah & Kotz. We then present a short summary (by no means exhaustive) of some well-known, recent generations of Weibull-related lifetime models for quick information. A brief discussion on the properties of this general cla...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:IEEE transactions on reliability 2007-09, Vol.56 (3), p.454-458
Hauptverfasser: Pham, Hoang, Lai, Chin-Diew
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 458
container_issue 3
container_start_page 454
container_title IEEE transactions on reliability
container_volume 56
creator Pham, Hoang
Lai, Chin-Diew
description This short communication first offers a clarification to a claim by Nadarajah & Kotz. We then present a short summary (by no means exhaustive) of some well-known, recent generations of Weibull-related lifetime models for quick information. A brief discussion on the properties of this general class is also given. Some future research directions on this topic are also discussed.
doi_str_mv 10.1109/TR.2007.903352
format Article
fullrecord <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_ieee_primary_4298248</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>4298248</ieee_id><sourcerecordid>2334193721</sourcerecordid><originalsourceid>FETCH-LOGICAL-c317t-cb7a5cd0cc353b34b13cee9c9a0a24dd6db40d0e11ef7add89be53fe162137a73</originalsourceid><addsrcrecordid>eNpdkEFLxDAQhYMouK5evXgpHry1JpmkTY6y6iosLJQVjyFNp9il265Je9Bfb0vFg6eZYb73eDxCrhlNGKP6fpcnnNIs0RRA8hOyYFKqmGWcnZIFpUzFWnJ9Ti5C2I-nEFotiNy2UY4O2z5aY4veNvW37euuDVFXRf0HRu9YF0PTRI916P24Ts9LclbZJuDV71ySt-en3eol3mzXr6uHTeyAZX3sisxKV1LnQEIBomDgELXTllouyjItC0FLioxhldmyVLpACRWylDPIbAZLcjf7Hn33OWDozaEODpvGttgNwUAKoBRM4O0_cN8Nvh2zGZWK0UzwdISSGXK-C8FjZY6-Plj_ZRg1U4Vml5upQjNXOApuZkGNiH-w4FpxoeAHgnZsRg</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>864137426</pqid></control><display><type>article</type><title>On Recent Generalizations of the Weibull Distribution</title><source>IEEE Electronic Library (IEL)</source><creator>Pham, Hoang ; Lai, Chin-Diew</creator><creatorcontrib>Pham, Hoang ; Lai, Chin-Diew</creatorcontrib><description>This short communication first offers a clarification to a claim by Nadarajah &amp; Kotz. We then present a short summary (by no means exhaustive) of some well-known, recent generations of Weibull-related lifetime models for quick information. A brief discussion on the properties of this general class is also given. Some future research directions on this topic are also discussed.</description><identifier>ISSN: 0018-9529</identifier><identifier>EISSN: 1558-1721</identifier><identifier>DOI: 10.1109/TR.2007.903352</identifier><identifier>CODEN: IERQAD</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Bathtub shape ; Context modeling ; Distribution functions ; failure rate function ; Hazards ; Humans ; Probability density function ; Random variables ; Reliability engineering ; Shape ; Systems engineering and theory ; Weibull distribution</subject><ispartof>IEEE transactions on reliability, 2007-09, Vol.56 (3), p.454-458</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2007</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c317t-cb7a5cd0cc353b34b13cee9c9a0a24dd6db40d0e11ef7add89be53fe162137a73</citedby><cites>FETCH-LOGICAL-c317t-cb7a5cd0cc353b34b13cee9c9a0a24dd6db40d0e11ef7add89be53fe162137a73</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/4298248$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,796,27924,27925,54758</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/4298248$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Pham, Hoang</creatorcontrib><creatorcontrib>Lai, Chin-Diew</creatorcontrib><title>On Recent Generalizations of the Weibull Distribution</title><title>IEEE transactions on reliability</title><addtitle>TR</addtitle><description>This short communication first offers a clarification to a claim by Nadarajah &amp; Kotz. We then present a short summary (by no means exhaustive) of some well-known, recent generations of Weibull-related lifetime models for quick information. A brief discussion on the properties of this general class is also given. Some future research directions on this topic are also discussed.</description><subject>Bathtub shape</subject><subject>Context modeling</subject><subject>Distribution functions</subject><subject>failure rate function</subject><subject>Hazards</subject><subject>Humans</subject><subject>Probability density function</subject><subject>Random variables</subject><subject>Reliability engineering</subject><subject>Shape</subject><subject>Systems engineering and theory</subject><subject>Weibull distribution</subject><issn>0018-9529</issn><issn>1558-1721</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2007</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNpdkEFLxDAQhYMouK5evXgpHry1JpmkTY6y6iosLJQVjyFNp9il265Je9Bfb0vFg6eZYb73eDxCrhlNGKP6fpcnnNIs0RRA8hOyYFKqmGWcnZIFpUzFWnJ9Ti5C2I-nEFotiNy2UY4O2z5aY4veNvW37euuDVFXRf0HRu9YF0PTRI916P24Ts9LclbZJuDV71ySt-en3eol3mzXr6uHTeyAZX3sisxKV1LnQEIBomDgELXTllouyjItC0FLioxhldmyVLpACRWylDPIbAZLcjf7Hn33OWDozaEODpvGttgNwUAKoBRM4O0_cN8Nvh2zGZWK0UzwdISSGXK-C8FjZY6-Plj_ZRg1U4Vml5upQjNXOApuZkGNiH-w4FpxoeAHgnZsRg</recordid><startdate>200709</startdate><enddate>200709</enddate><creator>Pham, Hoang</creator><creator>Lai, Chin-Diew</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope><scope>F28</scope><scope>FR3</scope></search><sort><creationdate>200709</creationdate><title>On Recent Generalizations of the Weibull Distribution</title><author>Pham, Hoang ; Lai, Chin-Diew</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c317t-cb7a5cd0cc353b34b13cee9c9a0a24dd6db40d0e11ef7add89be53fe162137a73</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2007</creationdate><topic>Bathtub shape</topic><topic>Context modeling</topic><topic>Distribution functions</topic><topic>failure rate function</topic><topic>Hazards</topic><topic>Humans</topic><topic>Probability density function</topic><topic>Random variables</topic><topic>Reliability engineering</topic><topic>Shape</topic><topic>Systems engineering and theory</topic><topic>Weibull distribution</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Pham, Hoang</creatorcontrib><creatorcontrib>Lai, Chin-Diew</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Electronics &amp; Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>ANTE: Abstracts in New Technology &amp; Engineering</collection><collection>Engineering Research Database</collection><jtitle>IEEE transactions on reliability</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Pham, Hoang</au><au>Lai, Chin-Diew</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>On Recent Generalizations of the Weibull Distribution</atitle><jtitle>IEEE transactions on reliability</jtitle><stitle>TR</stitle><date>2007-09</date><risdate>2007</risdate><volume>56</volume><issue>3</issue><spage>454</spage><epage>458</epage><pages>454-458</pages><issn>0018-9529</issn><eissn>1558-1721</eissn><coden>IERQAD</coden><abstract>This short communication first offers a clarification to a claim by Nadarajah &amp; Kotz. We then present a short summary (by no means exhaustive) of some well-known, recent generations of Weibull-related lifetime models for quick information. A brief discussion on the properties of this general class is also given. Some future research directions on this topic are also discussed.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/TR.2007.903352</doi><tpages>5</tpages></addata></record>
fulltext fulltext_linktorsrc
identifier ISSN: 0018-9529
ispartof IEEE transactions on reliability, 2007-09, Vol.56 (3), p.454-458
issn 0018-9529
1558-1721
language eng
recordid cdi_ieee_primary_4298248
source IEEE Electronic Library (IEL)
subjects Bathtub shape
Context modeling
Distribution functions
failure rate function
Hazards
Humans
Probability density function
Random variables
Reliability engineering
Shape
Systems engineering and theory
Weibull distribution
title On Recent Generalizations of the Weibull Distribution
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-20T00%3A07%3A51IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=On%20Recent%20Generalizations%20of%20the%20Weibull%20Distribution&rft.jtitle=IEEE%20transactions%20on%20reliability&rft.au=Pham,%20Hoang&rft.date=2007-09&rft.volume=56&rft.issue=3&rft.spage=454&rft.epage=458&rft.pages=454-458&rft.issn=0018-9529&rft.eissn=1558-1721&rft.coden=IERQAD&rft_id=info:doi/10.1109/TR.2007.903352&rft_dat=%3Cproquest_RIE%3E2334193721%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=864137426&rft_id=info:pmid/&rft_ieee_id=4298248&rfr_iscdi=true