An Experimental Analysis of SEU Sensitiveness on System Knowledge-based Hardening Techniques

Logic soft errors caused by radiation are a major concern when working with circuits that need to operate in harsh environments, such as space or avionics applications, where soft errors are traditionally referred as single event effects. In this paper, system knowledge-based hardening techniques us...

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Bibliographische Detailangaben

Hauptverfasser:	Ruano, O., Reyes, P., Maestro, J.A., Sterpone, L., Reviriego, P.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Aerospace electronics Circuit faults Discrete event simulation Emulation Filters Logic circuits Protection Radiation hardening Redundancy Single event upset
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