Near Field Microscopy for Nanostructure Quality Characterization in Millimeter Wave Range
Millimetre waves near-field microscopy are described. Examples of radio images (amplitude and phase pictures) optically opaque subjects with use of methods of near-field microscopy and also results of investigations of spatial inhomogeneity of properties in multilayered thin-film nanostructures with...
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| creator | Derkach, V.N. Tarapov, S.I. Nedukh, S.V. Anbinderis, T. Laurinavicius, A. |
| description | Millimetre waves near-field microscopy are described. Examples of radio images (amplitude and phase pictures) optically opaque subjects with use of methods of near-field microscopy and also results of investigations of spatial inhomogeneity of properties in multilayered thin-film nanostructures with effect of giant magnetic impedance are resulted in the field of frequencies 35-80GammaGammamu. |
| doi_str_mv | 10.1109/MSMW.2007.4294829 |
| format | Conference Proceeding |
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Examples of radio images (amplitude and phase pictures) optically opaque subjects with use of methods of near-field microscopy and also results of investigations of spatial inhomogeneity of properties in multilayered thin-film nanostructures with effect of giant magnetic impedance are resulted in the field of frequencies 35-80GammaGammamu.</abstract><pub>IEEE</pub><doi>10.1109/MSMW.2007.4294829</doi><tpages>3</tpages></addata></record> |
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| identifier | ISBN: 9781424412372 |
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| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Circuit testing Electronic equipment testing Frequency Integrated circuit testing Microscopy Microwave devices Microwave theory and techniques Millimeter wave measurements Millimeter wave technology Periodic structures |
| title | Near Field Microscopy for Nanostructure Quality Characterization in Millimeter Wave Range |
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