Near Field Microscopy for Nanostructure Quality Characterization in Millimeter Wave Range

Millimetre waves near-field microscopy are described. Examples of radio images (amplitude and phase pictures) optically opaque subjects with use of methods of near-field microscopy and also results of investigations of spatial inhomogeneity of properties in multilayered thin-film nanostructures with...

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Bibliographische Detailangaben
Hauptverfasser:	Derkach, V.N., Tarapov, S.I., Nedukh, S.V., Anbinderis, T., Laurinavicius, A.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Circuit testing Electronic equipment testing Frequency Integrated circuit testing Microscopy Microwave devices Microwave theory and techniques Millimeter wave measurements Millimeter wave technology Periodic structures
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Beschreibung
Zusammenfassung:	Millimetre waves near-field microscopy are described. Examples of radio images (amplitude and phase pictures) optically opaque subjects with use of methods of near-field microscopy and also results of investigations of spatial inhomogeneity of properties in multilayered thin-film nanostructures with effect of giant magnetic impedance are resulted in the field of frequencies 35-80GammaGammamu.
DOI:	10.1109/MSMW.2007.4294829