De-Embedding Considerations for High Q RFIC Inductors
In this paper, considerations for accurate de-embedding technique using the "open-thru" de-embedding methodology, aimed at de-embedding of high quality factor (Q) radio frequency integrated circuit (RFIC) inductors will be presented. In addition, proper design of on wafer ground-signal-gro...
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| creator | Goverdhanam, K. Tretiakov, Y. Rezvani, G.A. Kapur, S. Long, D.E. |
| description | In this paper, considerations for accurate de-embedding technique using the "open-thru" de-embedding methodology, aimed at de-embedding of high quality factor (Q) radio frequency integrated circuit (RFIC) inductors will be presented. In addition, proper design of on wafer ground-signal-ground-signal-ground (GSGSG) probe tip padset and de-embedding structures ("open" and "through") will be discussed. It will be shown, through EM simulations that accurate characterization of properly designed de-embedding structures results in very reliable and accurate de-embedding using the previously developed "open-thru" de-embedding method. |
| doi_str_mv | 10.1109/RFIC.2007.380921 |
| format | Conference Proceeding |
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| identifier | ISSN: 1529-2517 |
| ispartof | 2007 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium, 2007, p.449-452 |
| issn | 1529-2517 2375-0995 |
| language | eng |
| recordid | cdi_ieee_primary_4266469 |
| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Bridge circuits Circuit simulation De-embedding Impedance Inductance inductor characterization Inductors open-thru method padset Probes Q factor Radio frequency Radiofrequency integrated circuits Scattering parameters |
| title | De-Embedding Considerations for High Q RFIC Inductors |
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