Pseudo-Exhaustive Built-in Self-Testing of Signal Integrity for High-Speed SoC Interconnects

As technology approaches deep sub-micron technology and clock frequency approaches Giga Hertz, the signal integrity problem of the high speed interconnect is becoming a more and more serious issue. In this paper, we propose a pseudo-exhaustive testing scheme for signal integrity faults of high speed...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Liu, J., Jone, W.B., Das, S.R.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Automatic testing built-in self testing Built-in self-test capacitive coupling Circuit faults Circuit testing Crosstalk Electrical fault detection Fault detection inductive coupling Integrated circuit interconnections Pseudo-exhaustive testing Signal generators signal integrity testing Test pattern generators
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