Reliability Assessment of 1.55-μM Vertical Cavity Surface Emitting Lasers for Optical Communication Systems

In this paper, the long-term reliability of all monolithic 1.55-μm vertical cavity surface emitting lasers (VCSELs) is investigated. High-temperature storage tests and accelerated life tests are used to evaluate long-term VCSEL reliability. Variations of properties that depend on the operating condi...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Keun Ho Rhew, Su Chang Jeon, O-Kyun Kwon, Dae Hee Lee, Byung Soo Yoo, Ilgu Yun
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	accelerated life test Dark current High speed optical techniques Life estimation Life testing long-term reliability Optical fiber communication Power system reliability Stimulated emission Surface emitting lasers Threshold current vertical cavity surface emitting laser Vertical cavity surface emitting lasers
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