Discharge Protection and Ageing of Micromegas Pixel Detectors
GridPix is a gas-filled detector in which a Micromegas is combined with a CMOS pixel chip. The GridPix detector, originally developed for the readout of TPCs, can be applied as X-ray imaging device. With a drift gap of only one mm, GridPix could be well applied as radiation hard, low power, (and the...
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| creator | Aarts, A.A. Blanco Carballo, V.M. Chefdeville, M. Colas, P. Dunand, S. Fransen, M. van der Graaf, H. Giomataris, Y. Hartjes, F. Koffeman, E. Melai, J. Peek, H. Riegler, W. Salm, C. Schmitz, J. Smits, S.M. Timmermans, J. Visschers, J.L. Wyrsch, N. |
| description | GridPix is a gas-filled detector in which a Micromegas is combined with a CMOS pixel chip. The GridPix detector, originally developed for the readout of TPCs, can be applied as X-ray imaging device. With a drift gap of only one mm, GridPix could be well applied as radiation hard, low power, (and therefore) low-mass vertex (track) detector. A procedure to construct a Micromegas onto a Si wafer, using chip production technology ('wafer post processing'), has been developed. A method to protect the CMOS anode pixel chip against discharges has been studied. An ageing test of a Micromegas chamber has been carried out, after verifying the chamber's proportionality at a very high dose rate. |
| doi_str_mv | 10.1109/NSSMIC.2006.353833 |
| format | Conference Proceeding |
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An ageing test of a Micromegas chamber has been carried out, after verifying the chamber's proportionality at a very high dose rate.</description><subject>Aging</subject><subject>Anodes</subject><subject>CMOS technology</subject><subject>Production</subject><subject>Protection</subject><subject>Radiation detectors</subject><subject>Testing</subject><subject>X-ray detection</subject><subject>X-ray detectors</subject><subject>X-ray imaging</subject><issn>1082-3654</issn><issn>2577-0829</issn><isbn>9781424405602</isbn><isbn>1424405602</isbn><isbn>1424405610</isbn><isbn>9781424405619</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2006</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNo1jstOwzAURM1LIi39Adj4BxJsXz8XLKqUR6UWKrX7yjjXwahNkNMF_D1FwGqkOaOjIeSas4pz5m6f1-vlvK4EY7oCBRbghIy4FFIypTk7JYVQxpTMCndGJs7Yf8bEOSn4sS9BK3lJRsPwzphgIGVB7mZpCG8-t0hXuT9gOKS-o75r6LTF1LW0j3SZQu732PqBrtIn7ugMf4Z9Hq7IRfS7ASd_OSabh_tN_VQuXh7n9XRRJi2hbPA1SFTg0Cm0NoJUKvAodePh-FLbKBoMLsTgNceInBkpYuMNoPZRAYzJza82IeL2I6e9z19byY2zRsE3TFBM6g</recordid><startdate>200610</startdate><enddate>200610</enddate><creator>Aarts, A.A.</creator><creator>Blanco Carballo, V.M.</creator><creator>Chefdeville, M.</creator><creator>Colas, P.</creator><creator>Dunand, S.</creator><creator>Fransen, M.</creator><creator>van der Graaf, H.</creator><creator>Giomataris, Y.</creator><creator>Hartjes, F.</creator><creator>Koffeman, E.</creator><creator>Melai, J.</creator><creator>Peek, H.</creator><creator>Riegler, W.</creator><creator>Salm, C.</creator><creator>Schmitz, J.</creator><creator>Smits, S.M.</creator><creator>Timmermans, J.</creator><creator>Visschers, J.L.</creator><creator>Wyrsch, N.</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope></search><sort><creationdate>200610</creationdate><title>Discharge Protection and Ageing of Micromegas Pixel Detectors</title><author>Aarts, A.A. ; 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The GridPix detector, originally developed for the readout of TPCs, can be applied as X-ray imaging device. With a drift gap of only one mm, GridPix could be well applied as radiation hard, low power, (and therefore) low-mass vertex (track) detector. A procedure to construct a Micromegas onto a Si wafer, using chip production technology ('wafer post processing'), has been developed. A method to protect the CMOS anode pixel chip against discharges has been studied. An ageing test of a Micromegas chamber has been carried out, after verifying the chamber's proportionality at a very high dose rate.</abstract><pub>IEEE</pub><doi>10.1109/NSSMIC.2006.353833</doi><tpages>5</tpages><oa>free_for_read</oa></addata></record> |
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| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Aging Anodes CMOS technology Production Protection Radiation detectors Testing X-ray detection X-ray detectors X-ray imaging |
| title | Discharge Protection and Ageing of Micromegas Pixel Detectors |
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