A New High-Speed, Single Photon Imaging CCD for the Optical
We report on first measurements from test structures verifying a new design concept of a single photon imaging CCD for the optical. The results confirm the sensitivity of a novel avalanche diode to single electrons. Details of this structure which can be combined with a back illuminated sensor are d...
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| creator | Holl, P. Andritschke, R. Eckhardt, R. Hartmann, R. Koitsch, C. Lutz, G. Meidinger, N. Richter, R.H. Schaller, G. Soltau, H. Struder, L. Valceanu, G. |
| description | We report on first measurements from test structures verifying a new design concept of a single photon imaging CCD for the optical. The results confirm the sensitivity of a novel avalanche diode to single electrons. Details of this structure which can be combined with a back illuminated sensor are described, measurement results include I-V curves, dark rate and temperature dependency. In addition an avalanche diode with MOSFET readout will be presented as well as an ultra low noise pnCCD which is process compatible. The successful testing of these components proves the feasibility to produce a back-illuminated single photon sensitive CCD with high frame rates and high sensitivity in a wide wavelength range. |
| doi_str_mv | 10.1109/NSSMIC.2006.354202 |
| format | Conference Proceeding |
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The successful testing of these components proves the feasibility to produce a back-illuminated single photon sensitive CCD with high frame rates and high sensitivity in a wide wavelength range.</description><subject>Charge coupled devices</subject><subject>Diodes</subject><subject>Electron optics</subject><subject>High speed optical techniques</subject><subject>Optical design</subject><subject>Optical imaging</subject><subject>Optical sensors</subject><subject>Optoelectronic and photonic sensors</subject><subject>Temperature sensors</subject><subject>Testing</subject><issn>1082-3654</issn><issn>2577-0829</issn><isbn>9781424405602</isbn><isbn>1424405602</isbn><isbn>1424405610</isbn><isbn>9781424405619</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2006</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNo1jMtKw0AUQMcXmNb-gG7mA5x4585MHrgqqdpAbYXoukwmNw9Jm5AExL-3oK4OnAOHsVsJvpQQP2yz7DVNfAQIfGU0Ap6xmdSoNZhAwjnz0IShgAjjC7aIw-i_AV4yT568UIHR12w2jp8ACEprjz0u-Za--LqpapH1RMU9z5pj1RJ_q7upO_L0YKuT4Emy4mU38Kkmvuunxtn2hl2Vth1p8cc5-3h-ek_WYrN7SZPlRjQyNJMoyQCURe4ILSmnXFgUlqyNrVF5bpyTurQBolKBc4WJECIHUY4RUq5trtSc3f1-GyLa90NzsMP3XsswVtKoH-8LSzk</recordid><startdate>200610</startdate><enddate>200610</enddate><creator>Holl, P.</creator><creator>Andritschke, R.</creator><creator>Eckhardt, R.</creator><creator>Hartmann, R.</creator><creator>Koitsch, C.</creator><creator>Lutz, G.</creator><creator>Meidinger, N.</creator><creator>Richter, R.H.</creator><creator>Schaller, G.</creator><creator>Soltau, H.</creator><creator>Struder, L.</creator><creator>Valceanu, G.</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope></search><sort><creationdate>200610</creationdate><title>A New High-Speed, Single Photon Imaging CCD for the Optical</title><author>Holl, P. ; Andritschke, R. ; Eckhardt, R. ; Hartmann, R. ; Koitsch, C. ; Lutz, G. ; Meidinger, N. ; Richter, R.H. ; Schaller, G. ; Soltau, H. ; Struder, L. ; Valceanu, G.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i175t-fe500fdbce2ae3c3c7ddaeaa9a53bb5cc14fa622336ccd58208c08b282eb4ab33</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2006</creationdate><topic>Charge coupled devices</topic><topic>Diodes</topic><topic>Electron optics</topic><topic>High speed optical techniques</topic><topic>Optical design</topic><topic>Optical imaging</topic><topic>Optical sensors</topic><topic>Optoelectronic and photonic sensors</topic><topic>Temperature sensors</topic><topic>Testing</topic><toplevel>online_resources</toplevel><creatorcontrib>Holl, P.</creatorcontrib><creatorcontrib>Andritschke, R.</creatorcontrib><creatorcontrib>Eckhardt, R.</creatorcontrib><creatorcontrib>Hartmann, R.</creatorcontrib><creatorcontrib>Koitsch, C.</creatorcontrib><creatorcontrib>Lutz, G.</creatorcontrib><creatorcontrib>Meidinger, N.</creatorcontrib><creatorcontrib>Richter, R.H.</creatorcontrib><creatorcontrib>Schaller, G.</creatorcontrib><creatorcontrib>Soltau, H.</creatorcontrib><creatorcontrib>Struder, L.</creatorcontrib><creatorcontrib>Valceanu, G.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE/IET Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Holl, P.</au><au>Andritschke, R.</au><au>Eckhardt, R.</au><au>Hartmann, R.</au><au>Koitsch, C.</au><au>Lutz, G.</au><au>Meidinger, N.</au><au>Richter, R.H.</au><au>Schaller, G.</au><au>Soltau, H.</au><au>Struder, L.</au><au>Valceanu, G.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>A New High-Speed, Single Photon Imaging CCD for the Optical</atitle><btitle>2006 IEEE Nuclear Science Symposium Conference Record</btitle><stitle>NSSMIC</stitle><date>2006-10</date><risdate>2006</risdate><volume>3</volume><spage>1589</spage><epage>1594</epage><pages>1589-1594</pages><issn>1082-3654</issn><eissn>2577-0829</eissn><isbn>9781424405602</isbn><isbn>1424405602</isbn><eisbn>1424405610</eisbn><eisbn>9781424405619</eisbn><abstract>We report on first measurements from test structures verifying a new design concept of a single photon imaging CCD for the optical. The results confirm the sensitivity of a novel avalanche diode to single electrons. Details of this structure which can be combined with a back illuminated sensor are described, measurement results include I-V curves, dark rate and temperature dependency. In addition an avalanche diode with MOSFET readout will be presented as well as an ultra low noise pnCCD which is process compatible. The successful testing of these components proves the feasibility to produce a back-illuminated single photon sensitive CCD with high frame rates and high sensitivity in a wide wavelength range.</abstract><pub>IEEE</pub><doi>10.1109/NSSMIC.2006.354202</doi><tpages>6</tpages></addata></record> |
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| identifier | ISSN: 1082-3654 |
| ispartof | 2006 IEEE Nuclear Science Symposium Conference Record, 2006, Vol.3, p.1589-1594 |
| issn | 1082-3654 2577-0829 |
| language | eng |
| recordid | cdi_ieee_primary_4179315 |
| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Charge coupled devices Diodes Electron optics High speed optical techniques Optical design Optical imaging Optical sensors Optoelectronic and photonic sensors Temperature sensors Testing |
| title | A New High-Speed, Single Photon Imaging CCD for the Optical |
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