An Enhanced Prognostic Model for Intermittent Failures in Digital Electronics

This paper presents an enhanced prognostic model to predict remaining useful life. The model utilizes environmental loads and in-situ performance measurements in conjunction with two baseline prediction algorithms: life consumption monitoring (LCM) and uncertainty adjusted prognostics (UAP). Fusion...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Guangfan Zhang, Chiman Kwan, Xu, R., Vichare, N., Pecht, M.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Aerospace electronics Automation Condition monitoring Electrical resistance measurement Load modeling Prediction algorithms Predictive models Prognostics and health management Soldering Temperature measurement
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