A Test-Structure to Efficiently Study Threshold-Voltage Variation in Large MOSFET Arrays

A test-structure comprising a dual-slope integrating analog-to-digital converter, auto-zeroing circuitry, digital control logic and a large array of devices under test (DUTs) has been developed to isolate threshold voltage variation. Threshold-voltage (V T ) isolation is achieved by testing all DUTs...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Drego, N., Chandrakasan, A., Boning, D.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Analog-digital conversion Circuit testing Digital control Logic arrays Logic circuits Logic devices Logic testing MOS devices MOSFET circuits Threshold voltage
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