A Test-Structure to Efficiently Study Threshold-Voltage Variation in Large MOSFET Arrays
A test-structure comprising a dual-slope integrating analog-to-digital converter, auto-zeroing circuitry, digital control logic and a large array of devices under test (DUTs) has been developed to isolate threshold voltage variation. Threshold-voltage (V T ) isolation is achieved by testing all DUTs...
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| creator | Drego, N. Chandrakasan, A. Boning, D. |
| description | A test-structure comprising a dual-slope integrating analog-to-digital converter, auto-zeroing circuitry, digital control logic and a large array of devices under test (DUTs) has been developed to isolate threshold voltage variation. Threshold-voltage (V T ) isolation is achieved by testing all DUTs in the subthreshold regime where drain-to-source current is an exponential function of V T . Spice simulations show that the structure is at least an order of magnitude more sensitive to V T variation than to channel length variation. This, in combination with a hierarchical access scheme and leakage control system, allows efficient characterization of DeltaV T for ~70,000 NMOS and ~70,000 PMOS devices in a dense 2mm times 2mm DUT array |
| doi_str_mv | 10.1109/ISQED.2007.24 |
| format | Conference Proceeding |
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Threshold-voltage (V T ) isolation is achieved by testing all DUTs in the subthreshold regime where drain-to-source current is an exponential function of V T . Spice simulations show that the structure is at least an order of magnitude more sensitive to V T variation than to channel length variation. This, in combination with a hierarchical access scheme and leakage control system, allows efficient characterization of DeltaV T for ~70,000 NMOS and ~70,000 PMOS devices in a dense 2mm times 2mm DUT array</abstract><pub>IEEE</pub><doi>10.1109/ISQED.2007.24</doi><tpages>6</tpages></addata></record> |
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| ispartof | 8th International Symposium on Quality Electronic Design (ISQED'07), 2007, p.281-286 |
| issn | 1948-3287 1948-3295 |
| language | eng |
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| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Analog-digital conversion Circuit testing Digital control Logic arrays Logic circuits Logic devices Logic testing MOS devices MOSFET circuits Threshold voltage |
| title | A Test-Structure to Efficiently Study Threshold-Voltage Variation in Large MOSFET Arrays |
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