The Exponential Repair Assumption: Practical Impacts
For repairable systems, we assessed the impact of assuming that the repair follows an exponential distribution versus a lognormal distribution for systems with various ratios of MTBF to MRT and various levels of redundancy. Real repair times, as a rule, generally curve fit to the lognormal distribut...
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| creator | Carter, C.M. Malerich, A.W. |
| description | For repairable systems, we assessed the impact of assuming that the repair follows an exponential distribution versus a lognormal distribution for systems with various ratios of MTBF to MRT and various levels of redundancy. Real repair times, as a rule, generally curve fit to the lognormal distribution. We analyzed the system reliability parameters of R(t), Ao, and MTBDE. We found that reliability was sensitive to low values of the ratio MTBF to MRT, and to moderate and low redundancies. In all cases that displayed a statistically significant difference, the exponential repair assumption inflated system reliability |
| doi_str_mv | 10.1109/RAMS.2007.328052 |
| format | Conference Proceeding |
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In all cases that displayed a statistically significant difference, the exponential repair assumption inflated system reliability</description><identifier>ISSN: 0149-144X</identifier><identifier>ISBN: 9780780397668</identifier><identifier>ISBN: 0780397665</identifier><identifier>EISSN: 2577-0993</identifier><identifier>EISBN: 9780780397675</identifier><identifier>EISBN: 0780397673</identifier><identifier>DOI: 10.1109/RAMS.2007.328052</identifier><language>eng</language><subject>Aerospace electronics ; Automobiles ; Availability ; Density functional theory ; Exponential distribution ; Redundancy ; Reliability ; Software systems ; Steady-state ; Topology</subject><ispartof>2007 Annual Reliability and Maintainability Symposium, 2007, p.125-130</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/4126336$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,776,780,785,786,2051,4035,4036,27904,54898</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/4126336$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Carter, C.M.</creatorcontrib><creatorcontrib>Malerich, A.W.</creatorcontrib><title>The Exponential Repair Assumption: Practical Impacts</title><title>2007 Annual Reliability and Maintainability Symposium</title><addtitle>RAMS</addtitle><description>For repairable systems, we assessed the impact of assuming that the repair follows an exponential distribution versus a lognormal distribution for systems with various ratios of MTBF to MRT and various levels of redundancy. 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| identifier | ISSN: 0149-144X |
| ispartof | 2007 Annual Reliability and Maintainability Symposium, 2007, p.125-130 |
| issn | 0149-144X 2577-0993 |
| language | eng |
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| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Aerospace electronics Automobiles Availability Density functional theory Exponential distribution Redundancy Reliability Software systems Steady-state Topology |
| title | The Exponential Repair Assumption: Practical Impacts |
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