Misleading Metrics and Unsound Analyses

The authors demonstrate that the recommendations for analyzing productivity in the appendix to the ISO/IEC 15939 standard are inappropriate. They also show that problems with the ISO/IEC advice can be compounded if software engineers attempt to apply statistical process-control techniques to softwar...

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Veröffentlicht in:IEEE software 2007-03, Vol.24 (2), p.73-78
Hauptverfasser: Kitchenham, B., Jeffery, D.R., Connaughton, C.
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Jeffery, D.R.
Connaughton, C.
description The authors demonstrate that the recommendations for analyzing productivity in the appendix to the ISO/IEC 15939 standard are inappropriate. They also show that problems with the ISO/IEC advice can be compounded if software engineers attempt to apply statistical process-control techniques to software productivity metrics. They recommend using small meaningful data sets as the basis for productivity analysis and using effort-estimation models to assess productivity rather than productivity metrics. This article is part of a special focus section of software metrics
doi_str_mv 10.1109/MS.2007.49
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fullrecord <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_ieee_primary_4118654</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>4118654</ieee_id><sourcerecordid>880662864</sourcerecordid><originalsourceid>FETCH-LOGICAL-c412t-e43f0f45d820e6be888b7aae0f6830253a432aadc3323c166b158c8c7df010923</originalsourceid><addsrcrecordid>eNp90DtLA0EQAOBFFIzRxtYmCBoQLs4-bh9lCL4gwSKmXjZ7e3Lhchd3ckX-vRsSFCyspphvnoRcUxhRCuZxNh8xADUS5oT0qOEqE9SIU9IDJSBTIjfn5AJxBQA55dAjw1mFdXBF1XwOZmEbK48D1xSDRYNtl-K4cfUOA16Ss9LVGK6OsU8Wz08fk9ds-v7yNhlPMy8o22ZB8BJKkReaQZDLoLVeKucClFJzYDl3gjPnCs85455KuaS59tqrooS0P-N9Mjz03cT2qwu4tesKfahr14S2Q6s1SMm0FEne_yu5UFJIyhO8_QNXbRfTXWhZmi5AG5PQwwH52CLGUNpNrNYu7iwFu3-tnc3t_rVW7PHdsaND7-oyusZX-Fuhc8UNk8ndHFwVQvhJC0q1zAX_Bm5nfhQ</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>215840899</pqid></control><display><type>article</type><title>Misleading Metrics and Unsound Analyses</title><source>IEEE Electronic Library (IEL)</source><creator>Kitchenham, B. ; Jeffery, D.R. ; Connaughton, C.</creator><creatorcontrib>Kitchenham, B. ; Jeffery, D.R. ; Connaughton, C.</creatorcontrib><description>The authors demonstrate that the recommendations for analyzing productivity in the appendix to the ISO/IEC 15939 standard are inappropriate. They also show that problems with the ISO/IEC advice can be compounded if software engineers attempt to apply statistical process-control techniques to software productivity metrics. They recommend using small meaningful data sets as the basis for productivity analysis and using effort-estimation models to assess productivity rather than productivity metrics. This article is part of a special focus section of software metrics</description><identifier>ISSN: 0740-7459</identifier><identifier>EISSN: 1937-4194</identifier><identifier>DOI: 10.1109/MS.2007.49</identifier><identifier>CODEN: IESOEG</identifier><language>eng</language><publisher>Los Alamitos, CA: IEEE</publisher><subject>Application software ; Applied sciences ; Australia ; Communications technology ; Computer programs ; Computer science; control theory; systems ; Confidence intervals ; Confidentiality ; Control charts ; Coordinate measuring machines ; Criticism ; Data analysis ; Datasets ; effort estimation ; Estimates ; Exact sciences and technology ; IEC standards ; Information technology ; ISO standards ; ISO/IEC 15939 ; Jargon ; Measurement standards ; Measurement techniques ; Process control ; Process controls ; Productivity ; Productivity measurement ; productivity metrics ; Project management ; Quality control ; Quality standards ; Software ; Software engineering ; Software measurement ; Standard deviation ; Statistical process control</subject><ispartof>IEEE software, 2007-03, Vol.24 (2), p.73-78</ispartof><rights>2007 INIST-CNRS</rights><rights>Copyright IEEE Computer Society Mar/Apr 2007</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c412t-e43f0f45d820e6be888b7aae0f6830253a432aadc3323c166b158c8c7df010923</citedby><cites>FETCH-LOGICAL-c412t-e43f0f45d820e6be888b7aae0f6830253a432aadc3323c166b158c8c7df010923</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/4118654$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>315,782,786,798,27933,27934,54767</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/4118654$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&amp;idt=18573926$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Kitchenham, B.</creatorcontrib><creatorcontrib>Jeffery, D.R.</creatorcontrib><creatorcontrib>Connaughton, C.</creatorcontrib><title>Misleading Metrics and Unsound Analyses</title><title>IEEE software</title><addtitle>S-M</addtitle><description>The authors demonstrate that the recommendations for analyzing productivity in the appendix to the ISO/IEC 15939 standard are inappropriate. They also show that problems with the ISO/IEC advice can be compounded if software engineers attempt to apply statistical process-control techniques to software productivity metrics. They recommend using small meaningful data sets as the basis for productivity analysis and using effort-estimation models to assess productivity rather than productivity metrics. This article is part of a special focus section of software metrics</description><subject>Application software</subject><subject>Applied sciences</subject><subject>Australia</subject><subject>Communications technology</subject><subject>Computer programs</subject><subject>Computer science; control theory; systems</subject><subject>Confidence intervals</subject><subject>Confidentiality</subject><subject>Control charts</subject><subject>Coordinate measuring machines</subject><subject>Criticism</subject><subject>Data analysis</subject><subject>Datasets</subject><subject>effort estimation</subject><subject>Estimates</subject><subject>Exact sciences and technology</subject><subject>IEC standards</subject><subject>Information technology</subject><subject>ISO standards</subject><subject>ISO/IEC 15939</subject><subject>Jargon</subject><subject>Measurement standards</subject><subject>Measurement techniques</subject><subject>Process control</subject><subject>Process controls</subject><subject>Productivity</subject><subject>Productivity measurement</subject><subject>productivity metrics</subject><subject>Project management</subject><subject>Quality control</subject><subject>Quality standards</subject><subject>Software</subject><subject>Software engineering</subject><subject>Software measurement</subject><subject>Standard deviation</subject><subject>Statistical process control</subject><issn>0740-7459</issn><issn>1937-4194</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2007</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><sourceid>8G5</sourceid><sourceid>ABUWG</sourceid><sourceid>AFKRA</sourceid><sourceid>AZQEC</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><sourceid>GNUQQ</sourceid><sourceid>GUQSH</sourceid><sourceid>M2O</sourceid><recordid>eNp90DtLA0EQAOBFFIzRxtYmCBoQLs4-bh9lCL4gwSKmXjZ7e3Lhchd3ckX-vRsSFCyspphvnoRcUxhRCuZxNh8xADUS5oT0qOEqE9SIU9IDJSBTIjfn5AJxBQA55dAjw1mFdXBF1XwOZmEbK48D1xSDRYNtl-K4cfUOA16Ss9LVGK6OsU8Wz08fk9ds-v7yNhlPMy8o22ZB8BJKkReaQZDLoLVeKucClFJzYDl3gjPnCs85455KuaS59tqrooS0P-N9Mjz03cT2qwu4tesKfahr14S2Q6s1SMm0FEne_yu5UFJIyhO8_QNXbRfTXWhZmi5AG5PQwwH52CLGUNpNrNYu7iwFu3-tnc3t_rVW7PHdsaND7-oyusZX-Fuhc8UNk8ndHFwVQvhJC0q1zAX_Bm5nfhQ</recordid><startdate>20070301</startdate><enddate>20070301</enddate><creator>Kitchenham, B.</creator><creator>Jeffery, D.R.</creator><creator>Connaughton, C.</creator><general>IEEE</general><general>IEEE Computer Society</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>3V.</scope><scope>7WY</scope><scope>7WZ</scope><scope>7XB</scope><scope>87Z</scope><scope>88F</scope><scope>88I</scope><scope>88K</scope><scope>8AL</scope><scope>8FE</scope><scope>8FG</scope><scope>8FK</scope><scope>8FL</scope><scope>8G5</scope><scope>ABJCF</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>BEZIV</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>DWQXO</scope><scope>FRNLG</scope><scope>F~G</scope><scope>GNUQQ</scope><scope>GUQSH</scope><scope>HCIFZ</scope><scope>JQ2</scope><scope>K60</scope><scope>K6~</scope><scope>K7-</scope><scope>L.-</scope><scope>L6V</scope><scope>M0C</scope><scope>M0N</scope><scope>M1Q</scope><scope>M2O</scope><scope>M2P</scope><scope>M2T</scope><scope>M7S</scope><scope>MBDVC</scope><scope>P5Z</scope><scope>P62</scope><scope>PQBIZ</scope><scope>PQBZA</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>PTHSS</scope><scope>Q9U</scope><scope>7SC</scope><scope>7SP</scope><scope>8FD</scope><scope>F28</scope><scope>FR3</scope><scope>L7M</scope><scope>L~C</scope><scope>L~D</scope></search><sort><creationdate>20070301</creationdate><title>Misleading Metrics and Unsound Analyses</title><author>Kitchenham, B. ; Jeffery, D.R. ; Connaughton, C.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c412t-e43f0f45d820e6be888b7aae0f6830253a432aadc3323c166b158c8c7df010923</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2007</creationdate><topic>Application software</topic><topic>Applied sciences</topic><topic>Australia</topic><topic>Communications technology</topic><topic>Computer programs</topic><topic>Computer science; control theory; systems</topic><topic>Confidence intervals</topic><topic>Confidentiality</topic><topic>Control charts</topic><topic>Coordinate measuring machines</topic><topic>Criticism</topic><topic>Data analysis</topic><topic>Datasets</topic><topic>effort estimation</topic><topic>Estimates</topic><topic>Exact sciences and technology</topic><topic>IEC standards</topic><topic>Information technology</topic><topic>ISO standards</topic><topic>ISO/IEC 15939</topic><topic>Jargon</topic><topic>Measurement standards</topic><topic>Measurement techniques</topic><topic>Process control</topic><topic>Process controls</topic><topic>Productivity</topic><topic>Productivity measurement</topic><topic>productivity metrics</topic><topic>Project management</topic><topic>Quality control</topic><topic>Quality standards</topic><topic>Software</topic><topic>Software engineering</topic><topic>Software measurement</topic><topic>Standard deviation</topic><topic>Statistical process control</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Kitchenham, B.</creatorcontrib><creatorcontrib>Jeffery, D.R.</creatorcontrib><creatorcontrib>Connaughton, C.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>ProQuest Central (Corporate)</collection><collection>Access via ABI/INFORM (ProQuest)</collection><collection>ABI/INFORM Global (PDF only)</collection><collection>ProQuest Central (purchase pre-March 2016)</collection><collection>ABI/INFORM Global (Alumni Edition)</collection><collection>Military Database (Alumni Edition)</collection><collection>Science Database (Alumni Edition)</collection><collection>Telecommunications (Alumni Edition)</collection><collection>Computing Database (Alumni Edition)</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>ProQuest Central (Alumni) (purchase pre-March 2016)</collection><collection>ABI/INFORM Collection (Alumni Edition)</collection><collection>Research Library (Alumni Edition)</collection><collection>Materials Science &amp; Engineering Collection</collection><collection>ProQuest Central (Alumni Edition)</collection><collection>ProQuest Central UK/Ireland</collection><collection>Advanced Technologies &amp; Aerospace Collection</collection><collection>ProQuest Central Essentials</collection><collection>ProQuest Central</collection><collection>Business Premium Collection</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Central Korea</collection><collection>Business Premium Collection (Alumni)</collection><collection>ABI/INFORM Global (Corporate)</collection><collection>ProQuest Central Student</collection><collection>Research Library Prep</collection><collection>SciTech Premium Collection</collection><collection>ProQuest Computer Science Collection</collection><collection>ProQuest Business Collection (Alumni Edition)</collection><collection>ProQuest Business Collection</collection><collection>Computer Science Database</collection><collection>ABI/INFORM Professional Advanced</collection><collection>ProQuest Engineering Collection</collection><collection>ABI/INFORM Global</collection><collection>Computing Database</collection><collection>Military Database</collection><collection>Research Library</collection><collection>Science Database</collection><collection>Telecommunications Database</collection><collection>Engineering Database</collection><collection>Research Library (Corporate)</collection><collection>Advanced Technologies &amp; Aerospace Database</collection><collection>ProQuest Advanced Technologies &amp; Aerospace Collection</collection><collection>ProQuest One Business</collection><collection>ProQuest One Business (Alumni)</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><collection>Engineering Collection</collection><collection>ProQuest Central Basic</collection><collection>Computer and Information Systems Abstracts</collection><collection>Electronics &amp; Communications Abstracts</collection><collection>Technology Research Database</collection><collection>ANTE: Abstracts in New Technology &amp; Engineering</collection><collection>Engineering Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Computer and Information Systems Abstracts – Academic</collection><collection>Computer and Information Systems Abstracts Professional</collection><jtitle>IEEE software</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Kitchenham, B.</au><au>Jeffery, D.R.</au><au>Connaughton, C.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Misleading Metrics and Unsound Analyses</atitle><jtitle>IEEE software</jtitle><stitle>S-M</stitle><date>2007-03-01</date><risdate>2007</risdate><volume>24</volume><issue>2</issue><spage>73</spage><epage>78</epage><pages>73-78</pages><issn>0740-7459</issn><eissn>1937-4194</eissn><coden>IESOEG</coden><abstract>The authors demonstrate that the recommendations for analyzing productivity in the appendix to the ISO/IEC 15939 standard are inappropriate. They also show that problems with the ISO/IEC advice can be compounded if software engineers attempt to apply statistical process-control techniques to software productivity metrics. They recommend using small meaningful data sets as the basis for productivity analysis and using effort-estimation models to assess productivity rather than productivity metrics. This article is part of a special focus section of software metrics</abstract><cop>Los Alamitos, CA</cop><pub>IEEE</pub><doi>10.1109/MS.2007.49</doi><tpages>6</tpages></addata></record>
fulltext fulltext_linktorsrc
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ispartof IEEE software, 2007-03, Vol.24 (2), p.73-78
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1937-4194
language eng
recordid cdi_ieee_primary_4118654
source IEEE Electronic Library (IEL)
subjects Application software
Applied sciences
Australia
Communications technology
Computer programs
Computer science
control theory
systems
Confidence intervals
Confidentiality
Control charts
Coordinate measuring machines
Criticism
Data analysis
Datasets
effort estimation
Estimates
Exact sciences and technology
IEC standards
Information technology
ISO standards
ISO/IEC 15939
Jargon
Measurement standards
Measurement techniques
Process control
Process controls
Productivity
Productivity measurement
productivity metrics
Project management
Quality control
Quality standards
Software
Software engineering
Software measurement
Standard deviation
Statistical process control
title Misleading Metrics and Unsound Analyses
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-02T00%3A23%3A16IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Misleading%20Metrics%20and%20Unsound%20Analyses&rft.jtitle=IEEE%20software&rft.au=Kitchenham,%20B.&rft.date=2007-03-01&rft.volume=24&rft.issue=2&rft.spage=73&rft.epage=78&rft.pages=73-78&rft.issn=0740-7459&rft.eissn=1937-4194&rft.coden=IESOEG&rft_id=info:doi/10.1109/MS.2007.49&rft_dat=%3Cproquest_RIE%3E880662864%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=215840899&rft_id=info:pmid/&rft_ieee_id=4118654&rfr_iscdi=true